29 April 2016 Using linear polarization for sensing and monitoring nanoparticle purity
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We analyze the effect of contaminants on the quadrupolar magnetic, dipolar electric and dipolar magnetic resonances of silicon nanoparticles (NPs) by considering the spectral evolution of the linear polarization degree at right angle scattering configuration, PL(90°). From an optical point of view, a decrease in the purity of silicon nanoparticles due to the presence of contaminants impacts the NP effective refractive index. We study this effect for a silicon nanosphere of radius 200 nm embedded in different media. The weakness of the resonances induced on the PL(90°) spectrum because of the lack of purity can be used to quantify the contamination of the material. In addition, it is shown that Kerker conditions also suffer from a spectral shift, which is quantified as a function of material purity.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ángela I. Barreda Gomez, Ángela I. Barreda Gomez, Juan M. Sanz, Juan M. Sanz, Rodrigo Alcaraz de la Osa, Rodrigo Alcaraz de la Osa, José M. Saiz, José M. Saiz, Fernando Moreno, Fernando Moreno, Francisco González, Francisco González, Gorden Videen, Gorden Videen, } "Using linear polarization for sensing and monitoring nanoparticle purity", Proc. SPIE 9899, Optical Sensing and Detection IV, 98991O (29 April 2016); doi: 10.1117/12.2227774; https://doi.org/10.1117/12.2227774

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