29 July 2016 Zernike wavefront sensor (ZWFS) development for Low Order Wavefront Sensing (LOWFS)
Author Affiliations +
ZWFS is known to be photon noise optimal for measuring low order aberrations. Recently, ZWFS was selected as the baseline LOWFS technology on WFIRST for its sensitivity, accuracy, and its ease of integration with the starlight rejection mask. In this paper, we present the development of ZWFS sensor, including the algorithm description, sensitivity analysis, and some early experimental model validation results from a fabricated ZWFS phase mask on a standalone LOWFS testbed.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xu Wang, Xu Wang, Fang Shi, Fang Shi, J. Kent Wallace, J. Kent Wallace, "Zernike wavefront sensor (ZWFS) development for Low Order Wavefront Sensing (LOWFS)", Proc. SPIE 9904, Space Telescopes and Instrumentation 2016: Optical, Infrared, and Millimeter Wave, 990463 (29 July 2016); doi: 10.1117/12.2231252; https://doi.org/10.1117/12.2231252


Back to Top