A new type of X-ray interferometer consisting of a grating and an X-ray spectral imaging detector is proposed. Parallel X-ray beam irradiating a grating makes the fringes on the X-ray detector. Each fringe represents the profiles of the X-ray source, and superposition of those fringe images makes the accurate source profile, when diffraction is negligible. We estimate the angular resolution of this system with 1m distance between the grating and the detector is limited to about 6.5" for 12.4 keV X-rays in the condition that the diffraction is negligible. However, even when the diffraction is significant, e.g., with a finer pitch grating, interference, or more specifically the Talbot effect, make the clear fringes at a specific distance known as the Talbot distance. If we place the X-ray detector at a distance and select X-ray events meeting the Talbot condition, we expect the fringes that is a self image of the grating, representing the source profile. If we employ, for example, 5 μm pitch grating 25 cm apart from the detector and select 12.4 keV X-rays, the angular resolution of 2" or better is expected. We consider there are significant room to improvement. We also show the experimental setup we have started in our laboratory.