18 July 2016 Surface investigation and aluminum oxide estimation on test filters for the ATHENA X-IFU and WFI detectors
Author Affiliations +
Abstract
The ATHENA mission provides the demanded capabilities to address the ESA science theme "Hot and Energetic Universe". Two complementary instruments are foreseen: the X-IFU (X-ray Integral Field Unit) and WFI (Wide Field Imager). Both the instruments require filters to avoid that the IR radiation heats the X-IFU cryogenic detector and to protect the WFI detector from UV photons. Previous experience on XMM filters recommends to employ bilayer membrane consisting of aluminum deposited on polyimide. In this work, we use the X-ray Photoelectron Spectroscopy (XPS) to quantify the native aluminum oxide thickness that affects the spectral properties of the filter. The estimation of the oxide thickness of the prototype filter for ATHENA is a considerable information for the conceptual design of the filters.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Luisa Sciortino, Luisa Sciortino, Ugo Lo Cicero, Ugo Lo Cicero, Elena Magnano, Elena Magnano, Igor Píš, Igor Píš, Marco Barbera, Marco Barbera, } "Surface investigation and aluminum oxide estimation on test filters for the ATHENA X-IFU and WFI detectors", Proc. SPIE 9905, Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray, 990566 (18 July 2016); doi: 10.1117/12.2232376; https://doi.org/10.1117/12.2232376
PROCEEDINGS
8 PAGES


SHARE
Back to Top