The project is developing a Telescope Metrology System (TMS) which incorporates a large number of absolute distance measuring interferometers. The system will align optical components of the telescope to the instrument interface to (well) within the capture range of the active optics wavefront sensing systems. The advantages offered by this technological approach to a TMS, over a network of laser trackers, are discussed. Initial investigations of the Etalon Absolute Multiline Technology™ by Etalon Ag4 show that a metrology network based on this product is capable of meeting requirements. A conceptual design of the system is presented and expected performance is discussed.
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