You have requested a machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Neither SPIE nor the owners and publishers of the content make, and they explicitly disclaim, any express or implied representations or warranties of any kind, including, without limitation, representations and warranties as to the functionality of the translation feature or the accuracy or completeness of the translations.
Translations are not retained in our system. Your use of this feature and the translations is subject to all use restrictions contained in the Terms and Conditions of Use of the SPIE website.
9 August 2016Optical design of the slit-viewing camera for the NIRSPEC upgrade
NIRSPEC is a 1-5 μm high- and medium-resolution echelle spectrograph for the Keck II telescope, delivered in 1999 by the UCLA Infrared Laboratory (PI: Ian McLean). The instrument will be upgraded to replace detectors and electronics in the spectrograph (SPEC) and slit-viewing camera (SCAM). The existing SCAM design is limited to the 1-2.5 μm regime and optimized for the PICNIC 256x256 40-μm-pixel array. The upgrade of the SCAM to a Teledyne H1RG 1024x1024 18-μm-pixel array will allow imaging of the slit from 1-5 μm, increasing observing efficiency in the L and M bands. The extension of SCAM’s wavelength coverage requires re-optimization of its optical design. We present a proof-of-concept optical design of the new SCAM, optimized for a replacement detector. We discuss lens choices, design constraints, and the addition of blocking filters to mitigate saturation issues related to the high background levels in the thermal infrared.
The alert did not successfully save. Please try again later.
Emily C. Martin, Michael P. Fitzgerald, Ian S. McLean, Evan Kress, Eric Wang, "Optical design of the slit-viewing camera for the NIRSPEC upgrade," Proc. SPIE 9908, Ground-based and Airborne Instrumentation for Astronomy VI, 99082R (9 August 2016); https://doi.org/10.1117/12.2233767