22 July 2016 Evaluation of novel approach to deflectometry for high accuracy optics
Author Affiliations +
Abstract
A deflectometrical facility was developed at Italian National Institute for Astrophysics-OAB to characterize free-form optics with shape errors within few microns rms.

Deflectometry is an interesting technique because it allows the fast characterization of free-form optics. The capabilities of deflectometry in measuring medium-high frequencies are well known, but the low frequencies error characterization is more challenging. Our facility design foresees an innovative approach based on the acquisition of multiple direct images to enhance the performance on the challenging low frequencies range.

This contribution presents the error-budget analysis of the measuring method and a study of the configuration tolerances required to allow the use of deflectometry in the realization of optical components suitable for astronomical projects with a requirement of high accuracy for the optics. As test examples we took into account mirrors for the E-ELT telescope.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Giorgia Sironi, Rodolfo Canestrari, Kashmira Tayabaly, Giovanni Pareschi, "Evaluation of novel approach to deflectometry for high accuracy optics", Proc. SPIE 9912, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation II, 991213 (22 July 2016); doi: 10.1117/12.2233328; https://doi.org/10.1117/12.2233328
PROCEEDINGS
10 PAGES


SHARE
Back to Top