Deflectometry is an interesting technique because it allows the fast characterization of free-form optics. The capabilities of deflectometry in measuring medium-high frequencies are well known, but the low frequencies error characterization is more challenging. Our facility design foresees an innovative approach based on the acquisition of multiple direct images to enhance the performance on the challenging low frequencies range.
This contribution presents the error-budget analysis of the measuring method and a study of the configuration tolerances required to allow the use of deflectometry in the realization of optical components suitable for astronomical projects with a requirement of high accuracy for the optics. As test examples we took into account mirrors for the E-ELT telescope.