Submillimeter and far-infrared dielectric properties of thin films

Giuseppe Cataldo; Edward J. Wollack

doi:10.1117/12.2232648

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19 July 2016 Submillimeter and far-infrared dielectric properties of thin films

Giuseppe Cataldo, Edward J. Wollack

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Proceedings Volume 9914, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VIII; 99142W (2016) https://doi.org/10.1117/12.2232648
Event: SPIE Astronomical Telescopes + Instrumentation, 2016, Edinburgh, United Kingdom

Abstract

The complex dielectric function enables the study of a material's refractive and absorptive properties and provides information on a material's potential for practical application. Commonly employed line shape profile functions from the literature are briefly surveyed and their suitability for representation of dielectric material properties are discussed. An analysis approach to derive a material's complex dielectric function from observed transmittance spectra in the far-infrared and submillimeter regimes is presented. The underlying model employed satisfies the requirements set by the Kramers-Kronig relations. The dielectric function parameters derived from this approachtypically reproduce the observed transmittance spectra with an accuracy of < 4%.

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Giuseppe Cataldo and Edward J. Wollack "Submillimeter and far-infrared dielectric properties of thin films", Proc. SPIE 9914, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VIII, 99142W (19 July 2016); https://doi.org/10.1117/12.2232648

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