8 August 2016 High accuracy measurements of the intrapixel sensitivity of VIS to LWIR astronomical detectors: experimental demonstration
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Abstract
The reduction of systematic effects is necessary to improve the accuracy in imaging and astrometry. For example, in Euclid Mission which aims at carrying out accurate measurements of dark energy and quantifying precisely its role in the evolution of the Universe, systematic effects need at be controlled to a level better than 10-7 (Euclid, Science Book). To achieve this goal, a high-level of knowledge of the system point spread function (PSF) is required. This paper follows the concept-paper presented at the last SPIE conference1 and gives the recent developments achieved in the design of the test bench for the intrapixel sensitivity measurements. The measurement technique we use is based on the projection of a high spatial resolution periodic pattern on the detector using the self-imaging property of a new class of diffractive objects named continuously self-imaging gratings (CSIG) and developed at ONERA. The principle combines the potential of global techniques, which make measurements at once on the whole FPA, and the accuracy of spot-scan-based techniques, which provide high local precision.
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T. Viale, T. Viale, C. Ketchazo, C. Ketchazo, N. Guérineau, N. Guérineau, O. Boulade, O. Boulade, F. de la Barrière, F. de la Barrière, V. Moreau, V. Moreau, L. Mugnier, L. Mugnier, D. Dubreuil, D. Dubreuil, A. Bonnefois, A. Bonnefois, C. Delisle, C. Delisle, G. Druart, G. Druart, P. Mulet, P. Mulet, "High accuracy measurements of the intrapixel sensitivity of VIS to LWIR astronomical detectors: experimental demonstration", Proc. SPIE 9915, High Energy, Optical, and Infrared Detectors for Astronomy VII, 991517 (8 August 2016); doi: 10.1117/12.2232831; https://doi.org/10.1117/12.2232831
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