Thejaswi U. Tumkur,1 Chloe Doiron,1 Xiao Yang,1 Bo Li,1 Dayne F. Swearer,1 Benjamin W. Cerjan,1 Peter Nordlander,1 Naomi J. Halas,1 Pulickel M. Ajayan,1 Emilie Ringe,1 Isabell Thomann1
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We demonstrate the ability to map photo-induced gradient forces in materials, using a setup akin to atomic force microscopy. This technique allows for the simultaneous characterization of topographical features and optical near-fields in materials, with a high spatio-temporal resolution. We show that the near-field gradient forces can be translated onto electric fields, enabling the mapping of plasmonic hot-spots in gold nanostructures, and the resolution of sub-10 nm features in photocatalytic materials. We further show that the dispersion-sensitive nature of near-field gradient forces can be used to image and distinguish atomically thin layers of 2-D materials, with high contrast.
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Thejaswi U. Tumkur, Chloe Doiron, Xiao Yang, Bo Li, Dayne F. Swearer, Benjamin W. Cerjan, Peter Nordlander, Naomi J. Halas, Pulickel M. Ajayan, Emilie Ringe, Isabell Thomann, "Mapping near-field environments of plasmonic and 2D materials with photo-induced force imaging
(Conference Presentation)," Proc. SPIE 9918, Metamaterials, Metadevices, and Metasystems 2016, 99180N (9 November 2016); https://doi.org/10.1117/12.2239395