Open Access Paper
28 November 2016 Front Matter: Volume 9924
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 9924, including the Title Page, Copyright information, Table of Contents, and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Low-Dimensional Materials and Devices 2016, edited by Nobuhiko P. Kobayashi, A. Alec Talin, M. Saif Islam, Albert V. Davydov, Proceedings of SPIE Vol. 9924 (SPIE, Bellingham, WA, 2016) Six-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-786X (electronic)

ISBN: 9781510602397

ISBN: 9781510602403 (electronic)

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Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a six-digit CID article numbering system structured as follows:

  • The first four digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B ... 0Z, followed by 10-1Z, 20-2Z, etc.

Baldacci, L., 0J

Bi, Wengang, 03

Byles, Bryan W., 06

Cansizoglu, Hilal, 0C, 0U, 0V

Clites, Mallory, 05

Coletti, C., 0J

Cormia, Robert D., 0O

Degl'Innocenti, R., 0J

DeJarnette, Drew, 08

Díaz León, Juan J., 0I, 0O

Forcherio, Gregory T., 08

Fryauf, David M., 0O, 0S

Gao, Yang, 0C, 0V

Geng, Chong, 03

Ghandiparsi, Soroush, 0C, 0V

Huber, R., 0J

Islam, M. Saif, 0C, 0U, 0V

Jiang, Xiaofang, 03

Kaya, Ahmet, 0C, 0U, 0V

Kobayashi, Nobuhiko P., 0I, 0O, 0S

Lange, C., 0J

Maag, T., 0J

Mamtaz, Hasina H., 0U

Mayet, Ahmed S., 0C, 0U, 0V

Miseikis, V., 0J

Norris, Kate J., 0I

Phillips, Andrew C., 0S

Pitanti, A., 0J

Polat, Kazim G., 0V

Pomerantseva, Ekaterina, 05, 06

Ponizovskaya Devine, Ekaterina, 0V

Reggad, Hind, 0V

Roper, D. Keith, 08

Sevic, John F., 0I

Tredicucci, A., 0J

Wang, Shih-Yuan, 0C

Wang, Yichuan, 0V

Xu, Shu, 03

Yamada, Toshishige, 0C

Zanotto, S., 0J

Zhang, Runzhou, 0V

Zhao, Fei, 03

Conference Committee

Symposium Chairs

  • Harry A. Atwater Jr., California Institute of Technology (United States)

    Nikolay I. Zheludev, Optoelectronics Research Centre (United Kingdom) and Nanyang Technological University (Singapore)

Symposium Co-chairs

  • David L. Andrews, University of East Anglia (United Kingdom)

    James G. Grote, Air Force Research Laboratory (United States)

Conference Chairs

  • Nobuhiko P. Kobayashi, University of California, Santa Cruz (United States)

    A. Alec Talin, Sandia National Laboratories (United States)

    M. Saif Islam, University of California, Davis (United States)

    Albert V. Davydov, National Institute of Standards and Technology (United States)

Conference Program Committee

  • Kristine A. Bertness, National Institute of Standards and Technology (United States)

    Shadi A. Dayeh, Los Alamos National Laboratory (United States)

    Supratik Guha, IBM Thomas J. Watson Research Center (United States)

    Jung Han, Yale University (United States)

    Chennupati Jagadish, The Australian National University (Australia)

    Mutsumi Kimura, Ryukoku University (Japan)

    Takhee Lee, Gwangju Institute of Science and Technology (Korea, Republic of)

    Marina S. Leite, University of Maryland, College Park (United States)

    François Léonard, Sandia National Laboratories (United States)

    Samuel S. Mao, Lawrence Berkeley National Laboratory (United States)

    Sanjay Mathur, Universität zu Köln (Germany)

    Samuel T. Picraux, Los Alamos National Laboratory (United States)

    Paola Prete, Istituto per la Microelettronica e Microsistemi (Italy)

    Sharka M. Prokes, U.S. Naval Research Laboratory (United States)

    Zhifeng Ren, Boston College (United States)

    Atsuhito Sawabe, Aoyama Gakuin University (Japan)

    Fred Semendy, U.S. Army Research Laboratory (United States)

    Loucas Tsakalakos, GE Global Research (United States)

    Emanuel Tutuc, The University of Texas at Austin (United States)

    Lionel Vayssieres, Xi'an Jiaotong University (China)

    George T. Wang, Sandia National Laboratories (United States)

Session Chairs

  • 1 0D and 1D Nanodevices

    A. Alec Talin, Sandia National Laboratories (United States)

    Marina S. Leite, University of Maryland, College Park (United States)

  • 2 Battery Transport

    A. Alec Talin, Sandia National Laboratories (United States)

    Marina S. Leite, University of Maryland, College Park (United States)

  • 3 Nano-interfaces

    Nobuhiko P. Kobayashi, University of California, Santa Cruz (United States)

    George T. Wang, Sandia National Laboratories (United States)

  • 4 Characterization of Bulk and Nano-structures

    Albert V. Davydov, National Institute of Standards and Technology (United States)

  • 5 Sensors and Memristors

    Kimberlee C. Collins, Sandia National Laboratories (United States)

    François Léonard, Sandia National Laboratories (United States)

  • 6 Nanofiber and Nano-optical Characterization

    Ekaterina Pomerantseva, Drexel University (United States)

    Kimberlee C. Collins, Sandia National Laboratories (United States)

© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 9924", Proc. SPIE 9924, Low-Dimensional Materials and Devices 2016, 992401 (28 November 2016); https://doi.org/10.1117/12.2258072
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KEYWORDS
Current controlled current source

Oxides

Analytical research

Standards development

Liquid crystal on silicon

Nanofibers

Nanostructures

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