26 September 2016 Characterization and modeling tools for light management in heterogeneous thin film layers
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Abstract
The extraordinary progresses in the design and realization of structures in inorganic or organic thin films, whether or not including nanoparticles, make it possible to develop devices with very specific properties. Mastering the links between the macroscopic optical properties and the opto-geometrical parameters of these heterogeneous layers is thus a crucial issue. We propose to present the tools used to characterize and to model thin film layers, from an optical point of view, highlighting the interest of coupling both experimental and simulation studies for improving our knowledge on the optical response of the structure. Different examples of studies are presented on CIGS, Perovskite, P3HT:ZnO, PC70BM, organic layer containing metallic nanoparticles and colored solar cells.
Conference Presentation
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Le Rouzo, J. Le Rouzo, D. Duché, D. Duché, C. M. Ruiz, C. M. Ruiz, F. Thierry, F. Thierry, M. Carlberg, M. Carlberg, G. Berginc, G. Berginc, M. Pasquinelli, M. Pasquinelli, J.-J. Simon, J.-J. Simon, L. Escoubas, L. Escoubas, F. Flory, F. Flory, "Characterization and modeling tools for light management in heterogeneous thin film layers", Proc. SPIE 9929, Nanostructured Thin Films IX, 99290I (26 September 2016); doi: 10.1117/12.2237682; https://doi.org/10.1117/12.2237682
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