4 November 2016 Birefringent coherent diffraction imaging
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Abstract
Directional dependence of the index of refraction contains a wealth of information about anisotropic optical properties in semiconducting and insulating materials. Here we present a novel high-resolution lens-less technique that uses birefringence as a contrast mechanism to map the index of refraction and dielectric permittivity in optically anisotropic materials. We applied this approach successfully to a liquid crystal polymer film using polarized light from helium neon laser. This approach is scalable to imaging with diffraction-limited resolution, a prospect rapidly becoming a reality in view of emergent brilliant X-ray sources. Applications of this novel imaging technique are in disruptive technologies, including novel electronic devices, in which both charge and spin carry information as in multiferroic materials and photonic materials such as light modulators and optical storage.
Conference Presentation
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Dmitry Karpov, Dmitry Karpov, Tomy dos Santos Rolo, Tomy dos Santos Rolo, Hannah Rich, Hannah Rich, Yuriy Kryuchkov, Yuriy Kryuchkov, Boris Kiefer, Boris Kiefer, E. Fohtung, E. Fohtung, } "Birefringent coherent diffraction imaging", Proc. SPIE 9931, Spintronics IX, 99312F (4 November 2016); doi: 10.1117/12.2235865; https://doi.org/10.1117/12.2235865
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