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The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org. The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from these proceedings: Author(s), “Title of Paper,” in Reliability of Photovoltaic Cells, Modules, Components, and Systems IX, edited by Neelkanth G. Dhere, John H. Wohlgemuth, Keiichiro Sakurai, Proceedings of SPIE Vol. 9938 (SPIE, Bellingham, WA, 2016) Six digit article CID Number. ISSN: 0277-786X ISSN: 1996-786X (electronic) ISBN: 9781510602670 ISBN: 9781510602687 (electronic) Published by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time) · Fax +1 360 647 1445 Copyright © 2016, Society of Photo-Optical Instrumentation Engineers. Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/16/$18.00. Printed in the United States of America. Publication of record for individual papers is online in the SPIE Digital Library.
Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a six-digit CID article numbering system structured as follows:
AuthorsNumbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B...0Z, followed by 10-1Z, 20-2Z, etc. Adams, Jens, 0J Bakker, Klaas, 0C Bennett, Whit, 0Q, 0S Bheemreddy, Venkata, 0D Blumberg, Tiberius, 0J Booth, Dennis, 03 Bosman, Johan, 0C Brabec, Christoph J., 0J, 0L Bradley, Alex, 04 Bruckman, Laura S., 0I Buerhop, Claudia, 0J, 0L Camus, Christian, 0J, 0L Dalsass, Manuel, 0J Davis, Kristopher O., 0N Debernardi, Nicola, 0C DeNoyer, Lin, 0I Dhere, Neelkanth G., 0G, 0K Dhere, Ramesh G., 0K Dunne, Brendan, 0C Dusane, Rajiv O., 0G Elwood, Teri, 0Q, 0S Fagerholm, Cara L., 0I Felder, Thomas, 04 Fishgold, Asher, 0S Flammini, Marco Giacomo, 0C French, Roger H., 0I Funde, Adinath M., 0G Gambogi, William, 04 Garreau-Iles, Lucie, 04 Ghaisas, Subhash V., 0G Gok, Abdulkerim, 0I Gordon, Devin A., 0I Gu, Xiaohong, 0H Guo, Siyu, 0N Hardikar, Kedar Y., 0D Hauch, Jens, 0J, 0L Hu, Hongjie, 04 Jadkar, Sandesh R., 0G Kempe, Michael, 03 Lai, Teh, 0O, 0Q, 0S Le Ster, Maxime, 0C Lin, Chiao-Chi, 0H Liu, Bill J. J., 0D Lyu, Yadong, 0H Martin, Wayne R., 0K Martinez-Escobar, D., 0P Masuda, Atsushi, 0A Meyer, Corey W., 0I Miller, David, 03 Ogawa, Kinichi, 0A Ortega-Cruz, J., 0P Phillips, Nancy, 03 Pickel, Tobias, 0J, 0L Postak, Lori, 03 Potter, Barrett G. Jr., 0O, 0S Sakurai, Keiichiro, 0A Sánchez-Juárez, A., 0P Sánchez-Pérez, P. A., 0P Santos-Magdaleno, R., 0P Scheuerpflug, Hans, 0L Schmitz, Darshan, 0A Schneller, Eric, 0K, 0N Schoenfeld, Winston V., 0N Shibata, Hajime, 0A Shinde, Onkar S., 0G Simmons-Potter, Kelly, 0O, 0Q, 0S Stika, Katherine, 04 Sweet, Noah W., 0I Theelen, Mirjam, 0C Tokuda, Shuuji, 0A Tomita, Hiroshi, 0A Trout, T. John, 04 Walters, Joe, 0N Wohlgemuth, John, 03 Wrana, Simon, 0J Yu, Bao-Ling, 04 Yu, Li-Chieh, 0H Zetzmann, Cornelia, 0J Conference CommitteeSymposium Chair Conference Chairs
Conference Program Committee
Session Chairs
IntroductionSunday, 28 August Sunday morning, Session 1 on Encapsulant, Backsheet, Frontsheet, and Packaging Materials was chaired by Dr. Keiichiro Sakurai, National Institute of Advanced Industrial Science and Technology (Japan). Two invited papers were presented, “Investigation of a wedge adhesion test for edge seals,” by Kempe et al., and “Sequential accelerated tests: improving the correlation of accelerated tests to module performance in the field,” by Felder et al. Two contributed papers were also presented. Session 2 on Dust, Soiling was chaired by Dr. Michael D. Kempe, National Renewable Energy Lab (United States). An invited paper was presented, “Dust in the wind: Soiling of solar devices: Is there a Holy Grail solution?” by Kazmerski et al., followed by discussions on PV module degradation due to dust and soiling. Sunday afternoon, Session 3 on Thin Film PV Module Reliability, Standards was chaired by Christopher Flueckiger, Underwriters Laboratories Inc. (United States). An invited paper was presented, “Proposed new damp heat test standards for commercial CIGS modules with bias application or light irradiation,” by Sakurai et al., along with one contributed paper. Session 3 continued after the coffee break, with presentation of two invited papers,. “How heat influences CIGSSe solar cells properties,” by Flammini et al., and “SMART empirical approaches for predicting Field performance of PV modules from results of reliability tests,” by Hardikar. In the afternoon, Session 4 on Fault Detection and NEC Codes was chaired by Dr. Neelkanth G. Dhere, University of Central Florida (United States). An invited paper was presented, “Requirements for module level rapid shutdown in the 2017 National Electrical Code: a brand new call for high reliability in module level power electronics,” by Dr. Ward Bower. Monday, 29 August Monday morning, Session 5 on PV Module Reliability Accelerated and Outdoor Testing I was chaired by Tom Felder, E.I. du Pont Nemours and Co. (United States). An invited paper was presented, “Characterizing the weathering induced haze formation and gloss loss of poly(ethylene-terephthalate) via MaPd:RTS spectroscopy,” by Gordon et al., along with five contributed papers. After the morning Coffee break, Session 6 on PV Module Reliability Accelerated and Outdoor Testing II was chaired by Dr. Keiichiro Sakurai, National Institute of Advanced Industrial Science and Technology (Japan). An invited paper was presented, “Degradation of veteran Si modules in hot-humid locations in México,” by Dalia Martinez Escobar and colleagues, along with three contributed papers. The Optics + Photonics for Sustainable Energy Plenary Session took place on Monday afternoon. Dr. Christopher Flueckiger, of Underwriters Laboratories Inc. (United States) presented, “Qualifying materials for use in PV modules.” The Poster Session took place Monday evening with four poster presentations, one related to PV module reliability. Overall, the SPIE Reliability of Photovoltaic Cells, Modules, Components, and Systems IX Conference has good following and was very well-attended with participants from the United States, Mexico, Europe and Japan. There were 25 presentations. Two papers were withdrawn because the company closed its operations in the area and there were two no-shows. The discussion and question-answer sessions were very lively and interesting. We would like to thank the authors and other participants for their continuing interest and valuable support. Finally, let us thanks outgoing Conference Chair Dr. John H. Wohlgemuth, NREL, for his long-term and valuable contribution to this Conference. Let us also welcome Dr. Michael D. Kempe, NREL who has kindly agreed to join as a Conference Chair. Neelkanth G. Dhere John H. Wohlgemuth Keiichiro Sakurai |
