Presentation + Paper
26 September 2016 Proposed new damp heat test standards for commercial CIGS modules with bias application or light irradiation
Keiichiro Sakurai, Hiroshi Tomita, Kinichi Ogawa, Darshan Schmitz, Hajime Shibata, Shuuji Tokuda, Atsushi Masuda
Author Affiliations +
Abstract
Based on our results that conventional damp-heat (DDH) test on a commercial CCIGS (a.k.a. CCIS, CIGSS) module causes an irreversible "Test-specific" degradation (TSD) that is not observed in modules deployed in fields, we propose a new option for DDH testing of CIGS modules. We have tested full-size CIGS modules with/without forward bias, light irradiation and humidity during heat tests. The results clearly show that adding forward bias, or white light irradiation during DH tests suppresses this irreversible degradation. Based on these results, we have proposed to add forward bias and/or light irradiation during DH tests of CIGS modules, to make the test condition closer to real fields and suppress degradations not observed in the field.
Conference Presentation
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Keiichiro Sakurai, Hiroshi Tomita, Kinichi Ogawa, Darshan Schmitz, Hajime Shibata, Shuuji Tokuda, and Atsushi Masuda "Proposed new damp heat test standards for commercial CIGS modules with bias application or light irradiation", Proc. SPIE 9938, Reliability of Photovoltaic Cells, Modules, Components, and Systems IX, 99380A (26 September 2016); https://doi.org/10.1117/12.2237431
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Copper indium gallium selenide

Humidity

Neodymium

Photovoltaics

Sun

Bismuth

Ions

Back to Top