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The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org. The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from these proceedings: Author(s), “Title of Paper,” in Optical System Alignment, Tolerancing, and Verification X, edited by José Sasián, Richard N. Youngworth, Proceedings of SPIE Vol. 9951 (SPIE, Bellingham, WA, 2016) Six-digit Article CID Number. ISSN: 0277-786X ISSN: 9781510602946 (electronic) ISBN: 9781510602939 ISBN: 9781510602946 (electronic) Published by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time)· Fax +1 360 647 1445 Copyright © 2016, Society of Photo-Optical Instrumentation Engineers. Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/16/$18.00. Printed in the United States of America. Publication of record for individual papers is online in the SPIE Digital Library.
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AuthorsNumbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. Alves de Oliveira, Catarina, 0N Andre, James, 03 Antonille, Scott R., 05, 0C, 0D, 0N Aronstein, David L., 05, 0C Balderas-Mata, S. E., 0P Balonek, Gregory, 03 Bartoszyk, Andrew E., 05, 0C Beaton, Alexander, 0D Bergeron, Guy, 07 Berrier, Josh, 0C Beutler, Andreas, 0K Birkmann, Stephan, 0N Blake, Peter N., 08 Bond, Nicholas A., 0N Bos, Brent J., 08 Bowers, Charles W., 05 Campos-García, Manuel, 0M Cantin, Mario, 07 Chambers, Victor J., 08 Champagne, James, 02 Chang, William S., 0E Chesbrough, Christian, 03 Chrisp, Michael, 03 Chu, Jenny, 0E Clark, Kristin, 03 Cofie, Emmanuel, 05, 0C Collins, Nicholas R., 05 Comber, Brian J., 05 Coulter, Phillip, 08, 0C, 0D Davis, Clinton R., 0E, 0N Desnoyers, Nichola, 07 Díaz-Uribe, José Rufino, 0M Dixon, William V., 0N Edelstein, Jerry, 0Q Eder, Robert, 0F Ehrenwinkler, Ralf, 0F Eichhorn, William L., 05, 08, 0C, 0E Farey, Mike, 04 Flores Padilla, Deyanira, 0O Flores, Jorge L., 0P Fuchs, U., 0I Glasse, Alistair C., 05 Glassman, Tiffany, 04 Gracey, Renee M., 05, 06, 0C Greeley, Bradford W., 0E, 0N Gum, Jeffrey S., 08 Gunn, Chris, 0F Hadjimichael, Theodore J., 08, 0C Hagopian, John G., 08 Hartig, George F., 05, 0C, 0D, 0E Hayden, Joseph E., 08, 0C Hetherington, Samuel E., 08 Hooser, Preston, 02 Howard, Joseph M., 05, 06, 0C Huerta-Carranza, Oliver, 0M Hylan, Jason, 0C Ishikawa, Yuzo, 0Q Jensen, Peter, 0F Jimenez-Hernández, Hugo, 0O Johnson, Thomas E., 0F Kehoe, Michael, 0H Kelly, Douglas M., 05, 0D Kimble, Randy A., 05, 0E Kiontke, S. R., 0I Kirk, Jeffrey R., 05, 0E Kirner, Raoul, 0A Kreischer, Cody, 0H Kubalak, David A., 05, 06, 08, 0C, 0D, 0E Kuhn, William P., 09 Lamontagne, Frédéric, 07 Landsman, Wayne B., 05 Lee, David, 0D Levi, Josh, 04 Liepmann, Till, 04, 0G Lindler, Don J., 05 MacDonald, Robert, 03 Malaurie, Pauline, 0A Malumuth, Eliot M., 05, 0N Martel, André R., 0N Maszkiewicz, Michael, 05, 0D Mclean, Kyle F., 08, 0C McMann, Joseph C., 08 Medina-Marquez, J., 0P Melendez, Marcio, 0N Merkle, Frank, 0F Miskey, Cherie L., 05, 0C, 0N Moreno-Oliva, Víctor Iván, 0M Mott, Brent, 0F Mueller, Kevin, 0A Newswander, Trent, 02 Noell, Wilfried, 0A Ohl, Raymond G., 05, 08, 0C, 0D, 0E, 0N Parks, Robert E., 0J Peña-Conzueloa, Andrés, 0M Poppett, Claire, 0Q Primeau, Brian, 03 Redman, Kevin W., 08, 0C Reichard, Timothy A., 0N Reynosa Canseco, Jaqueline, 0O Rieke, Marcia J., 05 Roedel, Andreas, 0F Rohrbach, Scott O., 05, 06, 0C Rowlands, Neil, 05 Rumler, Peter, 0F Sabatke, Derek S., 05, 06, 0C, 0E, 0N Sampler, Henry P., 08 Santiago-Alvarado, Agustín, 0M Scharf, Toralf, 0A Schweiger, Paul, 0D Shiri, Ron, 0N Sigg, Daniel, xi Silber, Joseph H., 0Q Smith, Corbett T., 05 Smith, J. Scott, 05 Snodgrass, Stephen, 0F Speckmaier, Max, 0F Sullivan, Joseph F., 05, 0C, 0D, 0E, 0N Te Plate, Maurice, 05, 0D, 0F Telfer, Randal C., 05, 06, 0C, 0D, 0E Tournois, Severine C., 0E Trabert, M., 0I Tuell, Michael T., 0J Uhlendorf, K., 0L Vila, M. Begoña, 05 Voelkel, Reinhard, 0A Vogler, Uwe, 0A von Handorf, Robert J., 0E Ward, Justin, 0F Warner, Gerry D., 05 Wells, Martyn, 0D Wenzel, Greg W., 08, 0C Werschnik, J., 0L Wolf, Erin M., 0E Wright, David, 05 Wright, Raymond H., 05 Young, Jerrod L., 08 Zhou, Julia, 05 Zielinski, Thomas P., 05, 06, 0C Conference CommitteeProgram Track Chairs
Conference Chairs
Conference Program Committee
Session Chairs
IntroductionIn this year of 2016 the Optical Systems Alignment, Tolerancing, and Verification X conference celebrated its tenth anniversary! We all are delighted about the continued success of the conference. We thank the authors, audience, SPIE staff, and the conference committee for contributing to make the conference so successful and of interest to the optical engineering community. The conference has been always held on Sunday and arranged in four oral presentation sessions, with poster sessions on Monday and Wednesday. Papers contributed to Space Systems and JWST Alignment and Integration I; Alignment Methods and Algorithms; Space Systems and JWST Alignment and Integration II; and Aspheres, Tolerancing, and Verification. The talks about the JWST provided the audience with an update of the telescope and integration. These papers were insightful about the methodologies being used for the alignment and verification. In particular, instrument and pupil alignment issues were brought up as an important subject. We are especially grateful to Raymond G. Ohl for his role on attracting so many fine presentations about the JWST. Three papers we like to highlight are “A toolbox of metrology-based techniques for optical system alignment,” by Philip Coulter, et. al.; “Precision spacers as compensators,” by Michael R. Kehoe, et. al.; and “The structure function as a metric for roughness and figure,” by Robert Parks et. al. Reflecting on the last 10 years we realize that the optical engineering community has indeed emphasized the topics championed by the conference: Alignment, Tolerancing, and Verification. Today it is unthinkable to embark into a major project without addressing each of these topics, and we are starting to see many specialists in these fields. We believe that the conference has contributed to the awareness and development of such fields. We hope that the readers will enjoy and benefit from the collection of papers presented in this tenth volume. We look forward to another ten successful years to come, starting with our conference in 2017 at SPIE Optics and Photonics in San Diego. José Sasián Richard N. Youngworth |
