A toolbox of metrology-based techniques for optical system alignment

Phillip Coulter; Raymond G. Ohl; Peter N. Blake; Brent J. Bos; Victor J. Chambers; William L. Eichhorn; Jeffrey S. Gum; Theodore J. Hadjimichael; John G. Hagopian; Joseph E. Hayden; Samuel E. Hetherington; David A. Kubalak; Kyle F. Mclean; Joseph C. McMann; Kevin W. Redman; Henry P. Sampler; Greg W. Wenzel; Jerrod L. Young

doi:10.1117/12.2239070

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20 October 2016 A toolbox of metrology-based techniques for optical system alignment

Phillip Coulter, Raymond G. Ohl, Peter N. Blake, Brent J. Bos, Victor J. Chambers, William L. Eichhorn, Jeffrey S. Gum, Theodore J. Hadjimichael, John G. Hagopian, Joseph E. Hayden, Samuel E. Hetherington, David A. Kubalak, Kyle F. Mclean, Joseph C. McMann, Kevin W. Redman, Henry P. Sampler, Greg W. Wenzel, Jerrod L. Young

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Proceedings Volume 9951, Optical System Alignment, Tolerancing, and Verification X; 995108 (2016) https://doi.org/10.1117/12.2239070
Event: SPIE Optical Engineering + Applications, 2016, San Diego, California, United States

Abstract

The NASA Goddard Space Flight Center (GSFC) and its partners have broad experience in the alignment of flight optical instruments and spacecraft structures. Over decades, GSFC developed alignment capabilities and techniques for a variety of optical and aerospace applications. In this paper, we provide an overview of a subset of the capabilities and techniques used on several recent projects in a “toolbox” format. We discuss a range of applications, from small-scale optical alignment of sensors to mirror and bench examples that make use of various large-volume metrology techniques. We also discuss instruments and analytical tools.

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Phillip Coulter, Raymond G. Ohl, Peter N. Blake, Brent J. Bos, Victor J. Chambers, William L. Eichhorn, Jeffrey S. Gum, Theodore J. Hadjimichael, John G. Hagopian, Joseph E. Hayden, Samuel E. Hetherington, David A. Kubalak, Kyle F. Mclean, Joseph C. McMann, Kevin W. Redman, Henry P. Sampler, Greg W. Wenzel, and Jerrod L. Young "A toolbox of metrology-based techniques for optical system alignment", Proc. SPIE 9951, Optical System Alignment, Tolerancing, and Verification X, 995108 (20 October 2016); https://doi.org/10.1117/12.2239070

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