27 September 2016 A new experimental procedure of outgassing rate measurement to obtain more precise deposition properties of materials
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Outgassing rate measurement, or dynamic outgassing test, is used to obtain outgassing properties of materials, i.e., Total Mass Loss, “TML,” and Collected Volatile Condensed Mass, “CVCM.” The properties are used as input parameters for executing contamination analysis, e.g., calculating a prediction of deposition mass on a surface in a spacecraft caused by outgassed substances from contaminant sources onboard. It is likely that results obtained by such calculations are affected by the input parameters. Thus, it is important to get a sufficient experimental data set of outgassing rate measurements for extract good outgassing parameters of materials for calculation. As specified in the standard, ASTM E 1559, TML is measured by a QCM sensor kept at cryogenic temperature; CVCMs are measured at certain temperatures. In the present work, the authors propose a new experimental procedure to obtain more precise VCMs from one run of the current test time with the present equipment. That is, two of four CQCMs in the equipment control the temperature to cool step-by-step during the test run. It is expected that the deposition rate, that is sticking coefficient, with respect to temperature could be discovered. As a result, the sticking coefficient can be obtained directly between -50 and 50 degrees C with 5 degrees C step. It looks like the method could be used as an improved procedure for outgassing rate measurement. The present experiment also specified some issues of the new procedure. It will be considered in future work.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eiji Miyazaki, Eiji Miyazaki, Kazunori Shimazaki, Kazunori Shimazaki, Osamu Numata, Osamu Numata, Miyuki Waki, Miyuki Waki, Riyo Yamanaka, Riyo Yamanaka, Yugo Kimoto, Yugo Kimoto, } "A new experimental procedure of outgassing rate measurement to obtain more precise deposition properties of materials", Proc. SPIE 9952, Systems Contamination: Prediction, Control, and Performance 2016, 99520K (27 September 2016); doi: 10.1117/12.2238312; https://doi.org/10.1117/12.2238312


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