3 October 2016 Ultrafast electron microscopy for investigating fundamental physics phenomena
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Abstract
Recent experiments have shown that by combining a femtosecond laser with an electron microscope, dynamics at the nanoscale with femtosecond temporal resolution can be followed. These ultrafast electron microscopy (UEM) techniques have allowed a variety of experimental studies on nanoscale material systems to be conducted, including the ability to image plasmon dynamics in real time. We will discuss how UEM can also be used to study fundamental quantum problems, present some recent experimental results and we will discuss how future experimental improvements will push the temporal resolution from hundreds of femtoseconds down to the single femtosecond regime and below.
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Prawesh Dahal, Prawesh Dahal, Akrit Mudvari, Akrit Mudvari, Aashwin Basnet, Aashwin Basnet, Parker W. Brown, Parker W. Brown, Brett Barwick, Brett Barwick, } "Ultrafast electron microscopy for investigating fundamental physics phenomena", Proc. SPIE 9956, Ultrafast Nonlinear Imaging and Spectroscopy IV, 995604 (3 October 2016); doi: 10.1117/12.2237392; https://doi.org/10.1117/12.2237392
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