Phase unwrapping using binary-encoded fringe pattern for phase-shifting projected fringe profilometry

Nai-Jeng Cheng; Sih-Yue Chen; Wei-Hung Su

doi:10.1117/12.2240067

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7 September 2016 Phase unwrapping using binary-encoded fringe pattern for phase-shifting projected fringe profilometry

Nai-Jeng Cheng, Sih-Yue Chen, Wei-Hung Su

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Proceedings Volume 9958, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X; 995819 (2016) https://doi.org/10.1117/12.2240067
Event: SPIE Optical Engineering + Applications, 2016, San Diego, California, United States

Abstract

A phase unwrapping method by spatially encoding the fringe patterns is presented for phase-shifting projected fringe profilometry. For spatially isolated objects or surfaces with large depth discontinuities, unwrapping can be identified without ambiguity. Even though the surface color or reflectivity varies rapidly with position, it distinguishes the fringe order accurately.

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Nai-Jeng Cheng, Sih-Yue Chen, and Wei-Hung Su "Phase unwrapping using binary-encoded fringe pattern for phase-shifting projected fringe profilometry", Proc. SPIE 9958, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X, 995819 (7 September 2016); https://doi.org/10.1117/12.2240067

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