26 September 2016 Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces
Author Affiliations +
Abstract
Surface texturing plays an important role in trapping light in photovoltaic materials. Understanding and modeling diffuse scatter from various textured silicon surfaces should aid in increasing light trapping in these materials, as well as improving material characterization and inspection during manufacture. We have performed Mueller matrix bidirectional reflectance distribution function (BRDF) measurements from a variety of textured silicon surfaces. Simulations, using multiple reflection polarization ray tracing, reproduce many of the features in the data. Evidence for diffraction, however, can also be observed, suggesting that a purely ray-tracing approach is insufficient for accurately describing the scatter from these materials.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Thomas A. Germer, Thomas A. Germer, Martin Foldyna, Martin Foldyna, Zuzana Mrazkova, Zuzana Mrazkova, Guillaume Fischer, Guillaume Fischer, Etienne Drahi, Etienne Drahi, } "Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces", Proc. SPIE 9961, Reflection, Scattering, and Diffraction from Surfaces V, 996107 (26 September 2016); doi: 10.1117/12.2236976; https://doi.org/10.1117/12.2236976
PROCEEDINGS
13 PAGES


SHARE
Back to Top