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2 November 2016 X-ray echo spectroscopy (Conference Presentation)
Yuri V. Shvyd'ko
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Proceedings Volume 9963, Advances in X-Ray/EUV Optics and Components XI; 996309 (2016) https://doi.org/10.1117/12.2237155
Event: SPIE Optical Engineering + Applications, 2016, San Diego, California, United States
Abstract
X-ray echo spectroscopy, a counterpart of neutron spin-echo, was recently introduced [1] to overcome limitations in spectral resolution and weak signals of the traditional inelastic x-ray scattering (IXS) probes. An image of a point-like x-ray source is defocused by a dispersing system comprised of asymmetrically cut specially arranged Bragg diffracting crystals. The defocused image is refocused into a point (echo) in a time-reversal dispersing system. If the defocused beam is inelastically scattered from a sample, the echo signal acquires a spatial distribution, which is a map of the inelastic scattering spectrum. The spectral resolution of the echo spectroscopy does not rely on the monochromaticity of the x-rays, ensuring strong signals along with a very high spectral resolution. Particular schemes of x-ray echo spectrometers for 0.1-meV and 0.02-meV ultra-high-resolution IXS applications (resolving power > 10^8) with broadband ~5-13 meV dispersing systems will be presented featuring more than 1000-fold signal enhancement. The technique is general, applicable in different photon frequency domains.\\ [1.] Yu. Shvyd’ko, Phys. Rev. Lett. 116, accepted (2016), arXiv:1511.01526.
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Yuri V. Shvyd'ko "X-ray echo spectroscopy (Conference Presentation)", Proc. SPIE 9963, Advances in X-Ray/EUV Optics and Components XI, 996309 (2 November 2016); https://doi.org/10.1117/12.2237155
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KEYWORDS
X-rays
Spectral resolution
Spectroscopy
Laser scattering
Scattering
Crystals
Spectrometers
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