15 September 2016 Development of a high-energy Kirkpatrick Baez microscope
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Abstract
X-ray imaging of the laser produced plasma plays an important role in plasma diagnostics. Based on the urgent needs of conducting deeper and finer physical experiments, we developed a high-energy Kirkpatrick Baez microscope working at 17.48keV with a spectral resolution (E/▵E) of ~30. The concave spherical substrates was polished, ultrasonically cleaned and coated. The substrates have a radius of curvature of 20m with a roughness better than 0.3nm. The grazing incidence angles are designed at 0.7° and 0.73° for separate reflecting mirrors. The x-ray backlit imaging experiments show its spatial resolution is ~5.5μm at best focus. The effective field of view is measured to be ~90μm, which is consistent with the multilayer design. This article provides detailed informations for the optical design, multilayers coating and characterization of the microscope. The microscope promises to be a high-energy, high-resolution, and energy resolved X-ray diagnostics instrument for SG series laser facility.
Conference Presentation
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Yaran Li, Yaran Li, Baozhong Mu, Baozhong Mu, Qing Xie, Qing Xie, Xin Wang, Xin Wang, Zhanshan Wang, Zhanshan Wang, } "Development of a high-energy Kirkpatrick Baez microscope", Proc. SPIE 9963, Advances in X-Ray/EUV Optics and Components XI, 99630J (15 September 2016); doi: 10.1117/12.2240109; https://doi.org/10.1117/12.2240109
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