16 September 2016 Image-based characterization of microfocus x-ray target failure
Author Affiliations +
Abstract
X-ray targets in microfocus x-ray tubes fail primarily due to sublimation and evaporation of tungsten while exposed to the electron beam. The temperature at the point of impact of the electron beam depends on the beam energy (200-300 kV), the beam current (<10 mA), the cross section (<1 mm) and the intensity profile. In order to preserve the target for a reasonable lifetime, temperatures at the spot do not typically exceed 2500 C. As tungsten evaporates from the surface of the target, the surface starts to pit and this can affect the x-ray production in multiple ways: the photon flux decreases, the heel effect is enhanced, the effective spot size changes shape and/or size. Indirectly, the target damage incurred over time or due to intense use will undermine the image quality by reducing image contrast, changing the resolution or degrading the signal to noise ratio. A detailed description of how x-ray target damage is incurred and the potential impact on image quality is reviewed in detail. Experimental results showing the target damage and associated loss of image quality are discussed.
Conference Presentation
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vance S. Robinson, Thomas Raber, William R. Ross, "Image-based characterization of microfocus x-ray target failure", Proc. SPIE 9964, Advances in Laboratory-based X-Ray Sources, Optics, and Applications V, 996405 (16 September 2016); doi: 10.1117/12.2238968; https://doi.org/10.1117/12.2238968
PROCEEDINGS
5 PAGES + PRESENTATION

SHARE
RELATED CONTENT


Back to Top