19 September 2016 A characterization technique for nanosecond gated CMOS x-ray cameras
Author Affiliations +
We present a characterization technique for nanosecond gated CMOS cameras designed and built by Sandia National Laboratory under their Ultra-Fast X-ray Imager program. The cameras have been used to record images during HED physics experiments at Sandia’s Z Facility and at LLNL’s National Ignition Facility. The behavior of the camera’s fast shutters was not expected to be ideal since they propagate over a large pixel array of 25 mm x 12 mm, which could result in shutter timing skew, variations in the FWHM, and variations in the shutter’s peak response. Consequently, a detailed characterization of the camera at the pixel level was critical for interpreting the images. Assuming the pixel’s photo-response was linear, the shutter profiles for each pixel were simplified to a pair of sigmoid functions using standard non-linear fitting methods to make the subsequent analysis less computationally intensive. A pixel-level characterization of a ”Furi” camera showed frame-to-frame gain variations that could be normalized with a gain mask and significant timing skew at the sensor’s center column that could not be corrected. The shutter profiles for Furi were then convolved with data generated from computational models to forward fit images collected with the camera.
Conference Presentation
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Dayton, A. Carpenter, H. Chen, N. Palmer, P. Datte, P. Bell, M. Sanchez, L. Claus, G. Robertson, J. Porter, "A characterization technique for nanosecond gated CMOS x-ray cameras", Proc. SPIE 9966, Target Diagnostics Physics and Engineering for Inertial Confinement Fusion V, 996602 (19 September 2016); doi: 10.1117/12.2237882; https://doi.org/10.1117/12.2237882


X ray imaging with ePix100a a high speed, high...
Proceedings of SPIE (September 30 2016)
CT detector evaluation with complex random backgrounds
Proceedings of SPIE (March 12 2012)
High-speed x-ray imaging in high-power laser experiments
Proceedings of SPIE (March 17 2005)
Performance of a 512 x 512 gated CMOS imager with...
Proceedings of SPIE (October 15 2012)
Ultrafast Framing Of X-Ray Images
Proceedings of SPIE (February 01 1989)

Back to Top