3 October 2016 Single-grating interferometer for high-resolution phase-contrast imaging at synchrotron radiation sources
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Abstract
Synchrotron X-ray imaging is constantly achieving higher spatial resolution. In the field of grating-based phase- contrast imaging, these developments allow to directly resolve the interference patterns created by a phase grating without need for a analyzer grating. In this study we analyzed the performance of a single-grating interferometer and compared it to a conventional double-grating interferometer. Based on simulations and measurements of a test phantom we evaluated the sensitivity, resolution and signal to noise ratios of different setup configurations.
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A. Hipp, J. Herzen, J. U. Hammel, P. Lytaev, A. Schreyer, F. Beckmann, "Single-grating interferometer for high-resolution phase-contrast imaging at synchrotron radiation sources", Proc. SPIE 9967, Developments in X-Ray Tomography X, 996718 (3 October 2016); doi: 10.1117/12.2237582; https://doi.org/10.1117/12.2237582
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