3 October 2016 Developments in synchrotron x-ray micro-tomography for in-situ materials analysis at the Advanced Light Source
Author Affiliations +
The Advanced Light Source (ALS) is a third-generation synchrotron X-ray source that operates as a user facility with more than 40 beamlines hosting over 2000 users per year. Synchrotron sources like the ALS provide high quality X-ray beams, with flux that is several orders of magnitude higher than lab-based sources. This is particularly advantageous for dynamic applications because it allows for high-speed, high-resolution imaging and microscale tomography. The hard X-ray beamline 8.3.2 at the Advanced Light Source enables imaging of samples at high temperatures and pressures, with mechanical loading and other realistic conditions using environmental test cells. These test cells enable experimental observation of samples undergoing dynamic microstructural changes in-situ. We present recent instrumentation developments that allow for continuous tomography with scan rates approaching 1 Hz per 3D image. In addition, our use of iterative reconstruction techniques allows for improved image quality despite fewer images and low exposure times used during fast tomography compared to traditional Fourier reconstruction methods.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Harold S. Barnard, Harold S. Barnard, A. A. MacDowell, A. A. MacDowell, D. Y. Parkinson, D. Y. Parkinson, S. V. Venkatakrishnan, S. V. Venkatakrishnan, F. Panerai, F. Panerai, N. N. Mansour, N. N. Mansour, } "Developments in synchrotron x-ray micro-tomography for in-situ materials analysis at the Advanced Light Source", Proc. SPIE 9967, Developments in X-Ray Tomography X, 99671H (3 October 2016); doi: 10.1117/12.2238305; https://doi.org/10.1117/12.2238305


Flat lensless phase imager
Proceedings of SPIE (March 06 2016)
X-ray micro-tomography at the Advanced Light Source
Proceedings of SPIE (October 16 2012)
Ultrafast imaging of nanosecond pulse x-ray simulators
Proceedings of SPIE (February 10 2009)

Back to Top