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30 September 2016 Multi-station electron scrubbing and performance testing device of large-area MCP
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Microchannel Plates(MCP) have been widely used in X-ray detection, night vision and other fields. X-ray detection used in the field of space usually requires a lot of large area of MCPs. A set of multi-station electron scrubbing and performance testing device for large area MCP is developed in this paper. Four sets of large area electron source are designed for electron scrubbing. Aiming at single MCP and dual-MCP structure, the high voltage power system, signal processing module and mechanical control structure are designed to achieve scrubbing and testing of 4 groups of large area MCP at the same time. By using this device, the scrubbing and testing of large area MCPs of 106mm in diameter are achieved. The test results are given and analyzed.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yun-sheng Qian, LiMing Tang, ChengXin Song, Jian Liu, Cheng Feng, and Yijun Zhang "Multi-station electron scrubbing and performance testing device of large-area MCP", Proc. SPIE 9968, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII, 99680K (30 September 2016);


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