3 October 2016 Investigation of a near-infrared-ray computed tomography scanner
Author Affiliations +
Abstract
In the near-infrared-ray computed tomography (NIR-CT) scanner, NIR rays are produced from a light-emitting diode (LED) and detected using an NIR phototransistor (PT). The wavelengths of the LED peak intensity and the PT high sensitivity in the data table are both 940 nm. The photocurrents flowing through the PTR are converted into voltages using an emitter-follower circuit, and the output voltages are sent to a personal computer through an analog-digital converter. The NIR projection curves for tomography are obtained by repeated linear scans and rotations of the object, and the scanning is conducted in both directions of its movement.
Conference Presentation
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eiichi Sato, Eiichi Sato, Yasuyuki Oda, Yasuyuki Oda, Yuichi Satoi, Yuichi Satoi, Satoshi Yamaguchi, Satoshi Yamaguchi, Tomotaka Ishii, Tomotaka Ishii, Osahiko Hagiwara, Osahiko Hagiwara, Hiroshi Matsukiyo, Hiroshi Matsukiyo, Manabu Watanabe, Manabu Watanabe, Shinya Kusachi, Shinya Kusachi, } "Investigation of a near-infrared-ray computed tomography scanner", Proc. SPIE 9969, Radiation Detectors: Systems and Applications XVII, 99690I (3 October 2016); doi: 10.1117/12.2240111; https://doi.org/10.1117/12.2240111
PROCEEDINGS
6 PAGES + PRESENTATION

SHARE
RELATED CONTENT


Back to Top