Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 9987 including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.

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Author(s), "Title of Paper," in Electro-Optical and Infrared Systems: Technology and Applications XIII, edited by David A. Huckridge, Reinhard Ebert, Stephen T. Lee, Proceedings of SPIE Vol. 9987 (SPIE, Bellingham, WA, 2016) six-digit Article CID Number.

ISSN: 0277-786X

ISSN:1996-756X (electronic)

ISBN: 9781510603783

ISBN: 9781510603790 (electronic)

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Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a six-digit CID article numbering system structured as follows:

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  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B...0Z, followed by 10-1Z, 20-2Z, etc.

Adomeit, Uwe, 0L

An, Wei, 0Y

Aziz, Mohsin, 0T

Baan, Jan, 0F

Bacher, Emmanuel, 02

Bareła, Jarosław, 11, 12

Barrat, Catherine, 0V

Becker, Merlin, 09

Beyerer, Jürgen, 0I

Bijl, Piet, 0K, 0M, 0P

Blohm, Christian, 09

Blumberg, D. G., 0G

Braesicke, Katrin, 0N

Bürsing, Helge, 0N

Cao, Qipeng, 0Q

Carlsson, Uno P., 08

Chen, Jun, 0Y

Chmielewski, Krzysztof, 12

Choi, Jong Hwa, 0R

Christnacher, Frank, 02

Connor, Barry, 0H

Cook, T., 0C

Cumming, David R. S., 0T

Daumer, V., 0U

David, Yaara, 04

Dayan, I., 0G

Deng, Xinpu, 0Y

Dijk, Judith, 0E, 0F

Doctor, Alan, 0S

Dvinelis, Edgaras, 03

Eberle, Bernd, 0D

Eisele, Christian, 0A

Farley, Vincent, 06

Firmanty, Krzysztof, 11

Fischer, Noëlle M., 0F

Fortin, Vincent, 06

Fradcourt, Sébastien, 0V

Gagnon, Marc-André, 06

Gao, Chunfeng, 13, 14

Gardner, M. C., 0C

Ge, Xianying, 0Q

Geelen, Bert, 04

Geisel, Bärbel, 0N

Ginat, Ran, 04

Grauer, Yoav, 04

Grey, Matthew P., 08

Guyot, Éric, 06

Haraké, Laura, 09

Havemann, Stephan, 0O

Herrmann, Christian, 0I

Hicks, John E., 08

Hillemann, Markus, 09

Hogervorst, Maarten A., 0J, 0P

Hourani, Ramsey S., 08

Hugger, T., 0U

Ishimaru, Ichiro, 0B

Jayapala, Murali, 04

Jeong, Ho, 0R

Jin, Sang-Hun, 0R

Kabanov, Vladimir V., 07

Kastek, Mariusz, 11, 12

Kaušylas, Mindaugas, 03

Kerem, Samuel, 08

Keskin, Göksu, 09

Khalid, Ata, 0T

Kim, Sug-Whan, 0R

Kohn, N., 0U

Kong, Hyun Bae, 0R

Kooi, Frank L., 0M

Körber, Michael, 0D

Krieg, Jürgen, 0A

Krupiński, Michał, 11, 12

Kwon, Hyeuknam, 0R

Lagueux, Philippe, 06

Lambrechts, Andy, 04

Lebiadok, Yahor V., 07

Lenz, Andreas, 09

Lepot, Thierry, 0V

Levi, Eyal, 04

Lim, Jae Wan, 0R

Liu, Dongdong, 10

Long, Xingwu, 13, 14

Luppold, W., 0U

Ma, Haotong, 16

Maas, Bryan J., 08

Maman, S., 0G

Marcotte, Frédérick, 06

Marcotte, Kathryn, 08

Metzger, Nicolas, 02

Middelmann, Wolfgang, 09

Müller, R., 0U

Müller, Thomas, 0I

Mündel, Julia, 0N

Nakayama, Yoshihiko, 0B

Niemasz, J., 0U

Nieuwenhuizen, Robert P. J., 0E, 0F

Ogorzalek, Bernard S., 08

Osterman, Steven N., 08

Parker, Charles, 08

Paxton, Larry J., 08

Poyet, Jean-Michel, 02

Pusino, Vincenzo, 0T

Qi, Bo, 16

Ramamonjisoa, Michael, 0V

Rehm, R., 0U

Ren, Ge, 16

Ritt, Gunnar, 0D

Robertson, Neil M., 0H

Rodger, Iain, 0H

Rogers, P. J., 0C

Rotman, S., 0G

Rutz, F., 0U

Ryu, Dongok, 0R

Saito, Tsubasa, 0B

Schertzer, Stéphane, 02

Schilling, Hendrik, 09

Schmidt, J. 0U

Schmitz, J., 0U

Schutte, Klamer, 0E, 0F

Schwarz, Bastian, 0D

Seiffer, Dirk, 0A

Seong, Sehyun, 0R

Sha, Zhichao, 0Y

Shabrov, Denis V., 07

Shipton, A., 0C

Song, Ci, 0X

Spooren, Nick, 04

Stadelmann, T., 0U

Steer, Matthew J., 0T

Sugawara, Shigeru, 0B

Swiderski, Waldemar, 05

Tack, Klaas, 04

Taniguchi, Hideya, 0B

ter Haar, Frank B., 0F

Toet, Alexander, 0J, 0M

Tsutsui, Yasuyuki, 0B

Vallée, Réal, 06

van den Broek, Sebastiaan P., 0F

van der Stap, Nanda, 0F

Vizbaras, Augustinas, 03

Vizbaras, Dominykas, 03

Vizbaras, Kristijonas, 03

Wang, Chao, 0Q

Wang, Fugang, 0Q

Wang, Jicheng, 0X, 10

Wang, Qi, 13, 14

Wang, Qun, 13, 14

Wang, Xiaosai, 0X, 10

Wauro, M., 0U

Wei, Guo, 13, 14

Wilde, M. F., 0C

Willersinn, Dieter, 0I

Wong, Gerald, 0O

Wörl, A., 0U

Xia, Xiushan, 0X, 10

Xie, Chengzhi, 0T

Xie, Zongliang, 16

Xiong, Zhenyu, 13, 14

Yang, Jungang, 0Y

Yang, Seul Ki, 0R

Ye, Zhao, 0Q

Yin, Huan, 0Q

Yoshida, Mitsuhiro, 0B

Zhu, Jun, 0Q

Žukauskas, Tomas, 03

Conference Committee

Symposium Chairs

  • David H. Titterton, United Kingdom Defence Academy (United Kingdom)

Symposium Co-chairs

  • Ric Schleijpen, TNO Defence, Security and Safety (Netherlands)

  • Karin Stein, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • Stuart S. Duncan, Leonardo-Finmeccanica (United Kingdom)

Conference Chairs

  • David A. Huckridge, Ridgeway Consulting (United Kingdom)

  • Reinhard Ebert, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • Stephen T. Lee, Thales Optronics Ltd. (United Kingdom)

Conference Programme Committee

  • Christopher C. Alexay, StingRay Optics, LLC (United States)

  • Jan Y. Andersson, Acreo Swedish ICT AB (Sweden)

  • Gisele Bennett, Georgia Institute of Technology (United States)

  • Piet Bijl, TNO Earth, Life & Social Sciences (Netherlands)

  • Rainer Breiter, AIM INFRAROT-MODULE GmbH (Germany)

  • Gordon A. Cain, Vision4ce Ltd. (United Kingdom)

  • David J. Clarke, Placing Value Co.,Ltd (Thailand)

  • Gérard Destéfanis, Commissariat à l'Énergie Atomique (France)

  • Judith Dijk, TNO Defence, Security and Safety (Netherlands)

  • Bernd Eberle, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • Jean-Claude L. Fontanella, Thales Optronique S.A.S. (France)

  • Natan S. Kopeika, Ben-Gurion University of the Negev (Israel)

  • Robert A. Lamb, SELEX ES (United Kingdom)

  • Stephen T. Lee, Thales Optronics Ltd. (United Kingdom)

  • José Manuel López-Alonso, Universidad Complutense de Madrid (Spain)

  • John F. Parsons, Thales UK Ltd. (United Kingdom)

  • Stanley R. Rotman, Ben-Gurion University of the Negev (Israel)

  • Armin L. Schneider, Institut Franco-Allemand de Recherches de Saint-Louis (France)

  • Philip J. Soan, Defence Science and Technology Laboratory (United Kingdom)

Session Chairs

  • 1 Active Imaging

    Reinhard Ebert, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • 2 Electro-Optical System Design, Technology and Applications I

    David A. Huckridge, Ridgeway Consulting (United Kingdom)

    Reinhard Ebert, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • 3 Electro-Optical System Design, Technology and Applications II

    David A. Huckridge, Ridgeway Consulting (United Kingdom)

    Reinhard Ebert, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • 4 Image Processing

    Piet Bijl, TNO Earth, Life & Social Sciences (Netherlands)

    Philip J. Soan, Defence Science and Technology Laboratory (United Kingdom)

    John F. Parsons, Thales UK Ltd. (United Kingdom)

  • 5 Electro-Optical Systems: Performance Evaluation

    Judith Dijk, TNO Defence, Security and Safety (Netherlands)

  • 6 System Modelling

    Robert A. Lamb, Leonardo-Finmeccanica (United Kingdom)

  • 7 Detectors

    Bernd Eberle, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front Matter: Volume 9987", Proc. SPIE 9987, Electro-Optical and Infrared Systems: Technology and Applications XIII, 998701 (30 November 2016); doi: 10.1117/12.2264048; https://doi.org/10.1117/12.2264048
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