Presentation
3 October 2022 What is the correct unit for amplified spontaneous emission thresholds in organic thin films? (Conference Presentation)
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Abstract
Evaluating the lasing potential of light-emitting materials has become an important aspect of thin-film laser research. Measurement of Amplified Spontaneous Emission (ASE) thresholds is a widespread technique for this matter, but the question of whether measuring this threshold in energy or power density becomes relevant whenever pump duration and excited state lifetime share the same order of magnitude. By comparing thresholds of a DCM-based organic waveguide with 4 different pump durations, we establish that power density is the most appropriate unit even for pulses shorter than the excited state lifetime by a factor of 5.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Raphael Florentin, Sébastien Forget, and Sébastien Chénais "What is the correct unit for amplified spontaneous emission thresholds in organic thin films? (Conference Presentation)", Proc. SPIE PC12208, Organic and Hybrid Light Emitting Materials and Devices XXVI, PC122080P (3 October 2022); https://doi.org/10.1117/12.2633158
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KEYWORDS
Thin films

Laser damage threshold

Picosecond phenomena

Semiconductor lasers

Numerical simulations

Organic semiconductors

Perovskite

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