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3 October 2022 A novel X-ray beam monitoring and wavelength calibration using four-beam diffraction: theory and experiments (Conference Presentation)
XianRong Huang, Lahsen Assoufid, Xianbo Shi
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Proceedings Volume PC12240, Advances in X-Ray/EUV Optics and Components XVII; PC1224006 (2022) https://doi.org/10.1117/12.2633558
Event: SPIE Optical Engineering + Applications, 2022, San Diego, California, United States
Abstract
We demonstrate by rigorous dynamical theory calculations that four-beam diffraction (4BD) can be activated only by a unique photon energy and a unique incidence direction. Thus, 4BD may be used to precisely calibrate X-ray photon energies and beam positions. Based on the principles that the forbidden-reflection 4BD pattern, which is typically an X-shaped cross, can be generated by instant imaging using the divergent beam from a point source without rocking the crystal, we illustrate a detailed real-time high-resolution beam (and source) position monitoring scheme for monitoring two-dimensional beam positions and directions of modern synchrotron light sources, X-ray free-electron lasers and nano-focused X-ray sources. In particular, we will present our recent experiments that exactly verify this theory.
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XianRong Huang, Lahsen Assoufid, and Xianbo Shi "A novel X-ray beam monitoring and wavelength calibration using four-beam diffraction: theory and experiments (Conference Presentation)", Proc. SPIE PC12240, Advances in X-Ray/EUV Optics and Components XVII, PC1224006 (3 October 2022); https://doi.org/10.1117/12.2633558
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KEYWORDS
X-rays
Calibration
Diffraction
X-ray diffraction
Synchrotrons
X-ray sources
Precision calibration
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