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15 March 2023 Super-resolution localization microscopy with orientation and spectral discrimination (Conference Presentation)
Duncan Ryan, Peter M. Goodwin, James H. Werner, Somak Majumder, Jennifer A. Hollingsworth, Megan K. Dunlap, Alan K. Van Orden, Martin P. Gelfand
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Proceedings Volume PC12386, Single Molecule Spectroscopy and Superresolution Imaging XVI; PC123860C (2023) https://doi.org/10.1117/12.2647902
Event: SPIE BiOS, 2023, San Francisco, California, United States
Abstract
A dual-color super-resolution microscope with polarization and orientation-resolving capabilities is presented. Combining single-molecule localization methods with simultaneous polarization measurements enables the determination of the orientation of single emitters, such as quantum dot nanocrystals, with sub-10 nm precision. Additional simultaneous spectral characterization of particle emission allows the capture of multiple optical properties that impact energy transfer. We report on the instrumentation development and the results from coupled quantum dot clusters.
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Duncan Ryan, Peter M. Goodwin, James H. Werner, Somak Majumder, Jennifer A. Hollingsworth, Megan K. Dunlap, Alan K. Van Orden, and Martin P. Gelfand "Super-resolution localization microscopy with orientation and spectral discrimination (Conference Presentation)", Proc. SPIE PC12386, Single Molecule Spectroscopy and Superresolution Imaging XVI, PC123860C (15 March 2023); https://doi.org/10.1117/12.2647902
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KEYWORDS
Microscopy
Atmospheric particles
Super resolution
Quantum dots
Microscopes
Nanocrystals
Nanolithography
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