Poster
17 March 2023 Integration of a superconducting nanowire detector into a confocal microscope for TRPL-mapping: sensitivity and time resolution
Author Affiliations +
Conference Poster
Abstract
This conference presentation was prepared for the Single Molecule Spectroscopy and Superresolution Imaging XVI conference at SPIE BiOS, 2023.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Volker Buschmann, Eugeny Ermilov, Felix Koberling, Rainer Erdmann, Christian Oelsner, and Jürgen Breitlow "Integration of a superconducting nanowire detector into a confocal microscope for TRPL-mapping: sensitivity and time resolution", Proc. SPIE PC12386, Single Molecule Spectroscopy and Superresolution Imaging XVI, PC123860H (17 March 2023); https://doi.org/10.1117/12.2647548
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KEYWORDS
Sensors

Nanowires

Confocal microscopy

Microscopes

Superconductors

Luminescence

Quantum efficiency

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