Presentation
17 March 2023 Ultrafast imaging of THz-electric waveforms via Quantum-probe Field Microscopy (QFIM)
Author Affiliations +
Proceedings Volume PC12438, AI and Optical Data Sciences IV; PC124380K (2023) https://doi.org/10.1117/12.2649190
Event: SPIE OPTO, 2023, San Francisco, California, United States
Abstract
The novel field-resolved microscopy scheme of Quantum-probe Field Microscopy (QFIM) utilized fluorescence quanta to images local THz-electric waveforms [1]. In this contribution, we discuss the basis of the ultrafast microscopy scheme and the recovery of multi-Terahertz signals from fluorescence data. We elaborate fundamental aspects of time-domain sampling of electric waveforms and different strategies to recover response functions of systems under investigation. [1] M.B. Heindl, et al., “Ultrafast imaging of terahertz electric waveforms using quantum dots”, Light: Science & Applications 11, 2022.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Georg Herink, Moritz B. Heindl, Nick Kirkwood, Tobias Lauster, Julia A. Lang, Markus Retsch, and Paul Mulvaney "Ultrafast imaging of THz-electric waveforms via Quantum-probe Field Microscopy (QFIM)", Proc. SPIE PC12438, AI and Optical Data Sciences IV, PC124380K (17 March 2023); https://doi.org/10.1117/12.2649190
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KEYWORDS
Microscopy

Ultrafast imaging

Luminescence

Quantum dots

Terahertz radiation

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