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Ebook Topic:
Back Matter
Author(s): Jonathan D. Ellis
Published: 2014
DOI: 10.1117/
This section contains the bibliography, index, and author biography.



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bio1.jpg Jonathan D. Ellis is currently an Assistant Professor at the University of Rochester with a joint appointment in the Department of Mechanical Engineering and the Institute of Optics. He obtained his doctorate from the Delft University of Technology in the Netherlands, and M.S. and B.S. degrees from the University of North Carolina at Charlotte, all in mechanical engineering. He actively participates in SPIE, the Optical Society of America (OSA), and the American Society for Precision Engineering (ASPE). He currently serves as Director-at-Large and Treasurer for ASPE.

Professor Ellis’ research interests are in precision engineering, interferometry, optical metrology, instrumentation for primary standards level metrology, freeform optics fabrication and metrology, and precision scanning systems.


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