Ebook Topic:
Back Matter
This back matter contains the bibliography, index, and author's biography.



J. E. Greivenkamp, Field Guide to Geometrical Optics, SPIE Press, 2004.Google Scholar


M. Bass, Handbook of Optics, Vol. I & II, McGraw-Hill, New York, 1995.Google Scholar


E. Hecht and A. Zajac, Optics, Addison-Wesley, Massachusetts, 1974.Google Scholar


F. A. Jenkins and H. E. White, Fundamentals of Optics, McGraw-Hill, New York, 1981.Google Scholar


M. Born and E. Wolf, Principles of Optics, Pergamon Press, New York, 1986.Google Scholar


W. J. Smith, Modern Optical Engineering, McGraw-Hill, New York, 2000.Google Scholar


J. M. Lloyd, Thermal Imaging Systems, Plenum, New York, 1975.Google Scholar


R. D. Hudson, Infrared System Engineering, Wiley, New York, 1969.Google Scholar


E. L. Dereniak and G. D. Boreman, Infrared Detectors and Systems, John Wiley & Sons, New York, 1996.Google Scholar


W. L. Wolfe and G.J. Zissis, The Infrared Handbook Infrared Information Analysis (IRIA) Center, 1989.Google Scholar


G. D. Boreman, Fundamentals of Electro-Optics for Electrical Engineers, SPIE Press, 1998.Google Scholar


G. D. Boreman, Modulation Transfer Function in Optical and Electro-Optical Systems, SPIE Press, 2001.Google Scholar


R. W. Boyd, Radiometry and the Detection of Optical Radiation, Wiley, New York, 1983.Google Scholar


R. H. Kingston, Detection of Optical and Infrared Radiation, Springer-Verlag, New York, 1979.Google Scholar


R. J. Keyes, “Optical and infrared detectors,” Topics in Applied Physics, Vol. 19, Springer-Verlag, New York, 1980.Google Scholar


W. L. Wolfe, Introduction to Infrared Systems Design, SPIE Press, 1996.Google Scholar


G. C. Holst, Testing and Evaluation of Infrared Imaging Systems, JCD Pubishing, 1993.Google Scholar


G. C. Holst, Common Sense Approach to Thermal Imaging Systems, SPIE Press, 2000.Google Scholar


J. D. Gaskill, Linear Systems, Fourier Transforms, and Optics, Wiley, New York, 1978.Google Scholar


J. W. Goodman, Introduction to Fourier Optics, McGraw Hill, New York, 1968.Google Scholar


W. Wittenstain, J. C. Fontanella, A. R. Newbery, and J. Baars, “The definition of OTF and the measurement of aliasing for sampled imaging systems,” Optica Acta, Vol. 29, pp. 41-50 (1982).Google Scholar


S. K. Park, R. Schwengerdt, and M. Kaczynski, “MTF for sampled imaging systems,” Applied Optics, Vol. 23, pp. 2572-2582 (1984).Google Scholar


S. E. Reinchenbach, S. K. Park, and R. Narayanswamy, “Characterizing digital image acquisition devices,” Opt. Eng., Vol. 30(2), pp. 170-177 (1991).Google Scholar


A. Daniels, G. D. Boreman, A. D. Ducharme, and E. Sapir, “Random transparency targets for MTF measurement in the visible and infrared,” Opt. Eng., Vol. 34(3), pp. 860-868, March 1995.Google Scholar


G. D. Boreman and A. Daniels, “Use of spatial noise targets in image quality assessment,” (invited), Proceedings of International, Congress of Photographic Science, pp. 448-451, 1994.Google Scholar


A. Daniels and G. D. Boreman, “Diffraction Effects of infrared halftone transparencies,” Infrared Phys. Technol., Vol. 36(2), pp. 623-637, July 1995.Google Scholar


A. D. Ducharme and G. D. Boreman, “Holographic elements for modulation transfer function testing of detector arrays, Opt. Eng., Vol. 34(8), pp. 2455-2458, August 1995.Google Scholar


M. Sensiper, G. D. Boreman, and A. D. Ducharme, “MTF testing of detector arrays using narrow-band laser speckle,” Opt. Eng., Vol. 32(2), pp. 395-400 (1993).Google Scholar


G. D. Boreman, Y. Sun, and A. B. James, “Generation of random speckle with an integrating sphere,” Opt. Eng., Vol. 29(4), pp 339-342 (1993).Google Scholar

f09-110.jpg Arnold Daniels is a senior engineer with extensive experience in the development of advanced optical and electrooptical systems. His areas of expertise include applications for infrared search and imaging systems, infrared radiometry testing and measurements, thermographic nondestructive testing, Fourier analysis, image processing, data acquisition systems, precision optical alignment, and adaptive optics. He received a B.S. in Electro-Mechanical engineering from the University Autonomous of Mexico and a B.S. in Electrical engineering from the Israel Institute of Technology (Technion). He earned an M.S. in Electrical engineering from the University of Tel-Aviv and received a doctoral degree in Electro-Optics from the school of Optics (CREOL) at the University of Central Florida. In 1995 he received the Rudolf Kingslake medal and prize, which is awarded in recognition of themost noteworthy original paper to appear in SPIE’s journal Optical Engineering. He is presently developing aerospace systems for network centric operations and defense applications at Boeing-SVS.


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