Access to eBooks is limited to institutions that have purchased or currently subscribe to the SPIE eBooks program. eBooks are not available via an individual subscription. SPIE books (print and digital) may be purchased individually on SPIE.Org.

Contact your librarian to recommend SPIE eBooks for your organization.
Chapter 8:
Spatial Phase Shift Shearography with Multiple Carrier Frequencies
Chapter 7 introduced the SPS-DS method using a single carrier frequency. With the introduction of a single carrier frequency, the phase map corresponds to a single measurand (either out-of-plane deformation gradient or relative out-of-plane deformation) and can be measured from a single pair of speckle pattern images (before and after/during loading). This chapter will introduce some recent developments in SPS-DS containing multiple carrier frequencies. With multiple carrier frequencies, the SPS-DS system now is capable of measuring multiple measurands simultaneously from a single pair of speckle pattern images.
Online access to SPIE eBooks is limited to subscribing institutions.

Back to Top