Access to SPIE eBooks is limited to subscribing institutions. Access is not available as part of an individual subscription. However, books can be purchased on SPIE.Org
Chapter 8:
Spatial Phase Shift Shearography with Multiple Carrier Frequencies
Abstract
Chapter 7 introduced the SPS-DS method using a single carrier frequency. With the introduction of a single carrier frequency, the phase map corresponds to a single measurand (either out-of-plane deformation gradient or relative out-of-plane deformation) and can be measured from a single pair of speckle pattern images (before and after/during loading). This chapter will introduce some recent developments in SPS-DS containing multiple carrier frequencies. With multiple carrier frequencies, the SPS-DS system now is capable of measuring multiple measurands simultaneously from a single pair of speckle pattern images.
Online access to SPIE eBooks is limited to subscribing institutions.
CHAPTER 8
16 PAGES


SHARE
Back to Top