Chapter 7 introduced the SPS-DS method using a single carrier frequency.
With the introduction of a single carrier frequency, the phase map corresponds to a single measurand (either out-of-plane deformation gradient or relative out-of-plane deformation) and can be measured from a single pair of speckle pattern images (before and after/during loading). This chapter will introduce some recent developments in SPS-DS containing multiple carrier frequencies. With multiple carrier frequencies, the SPS-DS system now is capable of measuring multiple measurands simultaneously from a single pair of speckle pattern images.
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