High Aspect Ratio Processing
Editor(s): Prosenjit Rai-Choudhury
Author(s): Craig Friedrich, Robert Warrington, Walter Bacher, Werner Bauer, Philip Coane, Jost Göttert, Thomas Hanemann, Juergen Hausselt, Mathias Heckele, Regina Knitter, Jürgen Mohr, Volker Piotter, Robert Ruprecht
Published: 1997
Author Affiliations +
Abstract
The development of silicon microcomponents and microsystems, being an outgrowth of the processing techniques commonly used for the fabrication of integrated circuits, was constrained to mostly planar dimensions. This was because optical lithography and most photoresists were developed for this specific purpose. In many applications, however, the components require that the vertical dimensions be larger than those obtained by traditional optical lithography methods. This led to the development of high aspect ratio processing in which the vertical dimension can be large compared to the lateral dimensions. While there is no apparent agreed-upon definition of high aspect ratio, the processes are generally characterized by x-ray lithography and/or micromechanical machining methods, with postprocessing and replication methods suitable for the dimensions involved. While there have been many accomplishments toward making these processes as economically viable as integrated circuit processes, much work remains to be done. The following sections describe the high aspect ratio processes and replication techniques. The work is a compilation of efforts worldwide and is meant to provide an overview of the processes and techniques.
Online access to SPIE eBooks is limited to subscribing institutions.
Lens.org Logo
CITATIONS
Cited by 12 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Integrated circuits

Optical lithography

Photoresist developing

Fabrication

Light emitting diodes

Microsystems

Photoresist materials

Back to Top