Extreme Ultraviolet Lithography
Abstract
Since the resolution capability of lithography can be extended by using shortwavelength light, at least in principle, a number of concepts involving light with wavelengths much shorter than 193 nm have been proposed. Considerable effort has been applied to the development of one of these approaches, referred to as extreme ultraviolet (EUV) lithography. In this chapter, the basic concepts underlying EUV technology are discussed.
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KEYWORDS
Extreme ultraviolet

Extreme ultraviolet lithography

Photomasks

Reflectivity

Mirrors

Multilayers

Lithography

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