Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
Abstract
Since the resolution capability of lithography can be extended by using shortwavelength light, at least in principle, a number of concepts involving light with wavelengths much shorter than 193 nm have been proposed. Considerable effort has been applied to the development of one of these approaches, referred to as extreme ultraviolet (EUV) lithography. In this chapter, the basic concepts underlying EUV technology are discussed.
Online access to SPIE eBooks is limited to subscribing institutions.