Scientific Charge-Coupled Devices

Author(s): James R. Janesick

Published: 2001

https://doi.org/10.1117/3.374903

PDF ISBN: 9780819480392 | Print ISBN: 9780819436986

DESCRIPTION

The invention of the charge-coupled device 30 years ago was the beginning of a remarkable image capture technology that has changed the course of imaging in fields ranging from astronomy to biotechnology. This book presents a comprehensive history, tutorial, and state-of-the-art description of CCDs and is intended for scientists, engineers, imaging hardware managers, and graduate students.

BUY THIS BOOK ON SPIE.ORG

TABLE OF CONTENTS SHOW ALL CHAPTER OUTLINES +

SAVE THIS BOOK TO YOUR LIBRARY

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Remember Email/Username on this computer

Remember Password

No SPIE account? Create an account

Front Matter

DOWNLOAD PDF

Access to SPIE eBooks is limited to subscribing institutions. Access is not available as part of an individual subscription.

Purchase complete book on SPIE.org.

Shibboleth users login to see if you have access.

CHAPTER 1.

History, Operation, Performance, Design, Fabrication and Theory

Chapter Outline +

1.1 Scientific CCD History
1.2 Operation and Performance
1.2.1 Operation
1.2.2 Performance Functions
1.2.3 Performance Specifications
1.3 Architecture, Design, Photolitography and Fabrication
1.3.1 Architecture
1.3.2 Design and Photolithography
1.3.3 Processing and Fabrication
1.4 CCD Theory
1.4.1 MOS Capacitor
1.4.2 Surface-Channel Potential
1.4.3 Buried-Channel Potential Well
References
Further Reading

PERSONAL SIGN IN
Full access may be available with your subscription

Email or Username Forgot your username?

Password Forgot your password?

Show

Remember Email/Username on this computer

Remember Password

No SPIE account? Create an account
or Institutional Sign In via Shibboleth

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $0.00

Non-members: $0.00 ADD TO CART

Access to SPIE eBooks is limited to subscribing institutions. Access is not available as part of an individual subscription.

Purchase complete book on SPIE.org.

Shibboleth users login to see if you have access.

CHAPTER 2.

CCD Transfer Curves and Optimization

Chapter Outline +

2.1 CCD Transfer Curves
2.1.1 CCD Performance
2.1.2 CCD Camera Performance
2.1.3 CCD Camera Calibration
2.2 Photon Transfer
2.2.1 Photon Transfer Derivation
2.2.2 Photon Transfer
2.2.3 Camera Gain Constants
2.2.4 Camera Gain Histogram
2.2.5 Camera Gain Uncertainty
2.2.6 Dynamic Range
2.2.7 Linearity
2.2.8 Flat-Field Signal-to-Noise
2.2.9 Contrast Signal-to-Noise
2.2.10 High-Speed Photon Transfer Generation
2.2.11 Photon Transfer Simulation
2.3 X-Ray Transfer
2.3.1 X-ray Characteristics
2.3.2 Fe55
2.3.3 X-ray Images
2.3.4 X-ray Transfer
2.3.5 X-ray Histograms
2.3.6 Fano-Noise-Limited Performance
2.3.7 Cadmium X Rays
2.4 QE Transfer
2.5 CCD Clock and Bias Optimization
2.5.1 Clock and Bias
2.5.2 Set-point Transfer Curves
References

PERSONAL SIGN IN
Full access may be available with your subscription

Email or Username Forgot your username?

Password Forgot your password?

Show

Remember Email/Username on this computer

Remember Password

No SPIE account? Create an account
or Institutional Sign In via Shibboleth

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $0.00

Non-members: $0.00 ADD TO CART

Access to SPIE eBooks is limited to subscribing institutions. Access is not available as part of an individual subscription.

Purchase complete book on SPIE.org.

Shibboleth users login to see if you have access.

CHAPTER 3.

Charge Generation

Chapter Outline +

3.1 Charge Generation
3.2 QE Formulas
3.2.1 Backside Illumination
3.2.2 Frontside Illumination
3.2.3 Miscellaneous QE Losses
3.2.4 Monte Carlo Simulation
3.3 Frontside Illumination
3.3.1 Phosphor Coatings
3.3.2 Virtual Phase
3.3.3 Open Pinned Phase
3.3.4 Thin Gate
3.3.5 Transparent Gate
3.3.6 Poly Hole Gate
3.4 Backside Illumination
3.4.1 Thinning
3.4.2 Quantum Efficiency Hysteresis
3.4.3 Accumulation and QE Pinning
3.4.4 Self-Accumulation
3.4.5 Accumulation Theory
3.4.6 Passive Accumulation
3.4.7 Active accumulation
3.4.8 Antireflection coatings
References

PERSONAL SIGN IN
Full access may be available with your subscription

Email or Username Forgot your username?

Password Forgot your password?

Show

Remember Email/Username on this computer

Remember Password

No SPIE account? Create an account
or Institutional Sign In via Shibboleth

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $0.00

Non-members: $0.00 ADD TO CART

Access to SPIE eBooks is limited to subscribing institutions. Access is not available as part of an individual subscription.

Purchase complete book on SPIE.org.

Shibboleth users login to see if you have access.

CHAPTER 4.

Charge Collection

Chapter Outline +

4.1 Charge Collection
4.2 Well Capacity
4.2.1 Bloomed Full Well
4.2.2 Surface Full Well
4.2.3 Optimum Full Well
4.2.4 Clocking Modes
4.2.5 Full Well Transfer
4.2.6 Full Well Data
4.2.7 Self-induced Emission and Thermionic Emission
4.2.8 Clocked Antiblooming
4.2.9 Antiblooming Structures
4.2.10 High-Speed Erasure
4.2.11 Window Clocking
4.2.12 Multipinned Phase (MPP)
4.3 Fixed-pattern Noise
4.3.1 Pixel Nonuniformity
4.3.2 Flat Fielding
4.3.3 Fixed-pattern Sources
4.4 Charge Diffusion
4.4.1 Charge Diffusion
4.4.2 Measurement and Modeling Techniques
4.4.3 Aliasing and Beating
References

PERSONAL SIGN IN
Full access may be available with your subscription

Email or Username Forgot your username?

Password Forgot your password?

Show

Remember Email/Username on this computer

Remember Password

No SPIE account? Create an account
or Institutional Sign In via Shibboleth

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $0.00

Non-members: $0.00 ADD TO CART

Access to SPIE eBooks is limited to subscribing institutions. Access is not available as part of an individual subscription.

Purchase complete book on SPIE.org.

Shibboleth users login to see if you have access.

CHAPTER 5.

Charge Transfer

Chapter Outline +

5.1 Charge Transfer
5.2 Transfer Mechanisms
5.2.1 Diffusion Drift
5.2.2 Self-induced Drift
5.2.3 Fringing Field Drift
5.2.4 High-Speed Data
5.2.5 Clock Propagation
5.2.6 Substrate Bounce
5.3 CTE Measurement Techniques
5.3.1 X-ray Transfer
5.3.2 Extended Pixel Edge Response (EPER)
5.3.3 First Pixel Edge Response
5.3.4 Pocket Pumping
5.3.5 Charge Injection
5.4 Traps
5.4.1 Design Traps
5.4.2 Process traps
5.4.3 Bulk Traps
5.4.4 Radiation-induced
5.4.5 Proportional and Fixed Loss
5.4.6 Fat-zero
5.4.7 Notch Channel CCD
5.5 Transfer Power
5.5.1 Charge Motion Power
5.5.2 Potential Power
5.5.3 Reactive Power
References

PERSONAL SIGN IN
Full access may be available with your subscription

Email or Username Forgot your username?

Password Forgot your password?

Show

Remember Email/Username on this computer

Remember Password

No SPIE account? Create an account
or Institutional Sign In via Shibboleth

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $0.00

Non-members: $0.00 ADD TO CART

Access to SPIE eBooks is limited to subscribing institutions. Access is not available as part of an individual subscription.

Purchase complete book on SPIE.org.

Shibboleth users login to see if you have access.

CHAPTER 6.

Charge Measurement

Chapter Outline +

6.1 Charge Measurement
6.2 Output Amplifier Characteristics
6.2.1 Operation
6.2.2 Voltage Gain
6.2.3 Loading
6.2.4 Output Impedance
6.2.5 Time Response
6.2.6 Frequency Response
6.2.7 Bias
6.2.8 Sensitivity
6.2.9 Linearity
6.2.10 Temperature Characteristics
6.2.11 Lightly Doped Drain
6.2.12 Amplifier Luminescence
6.2.13 Multistage Amplifiers
6.2.14 Power Consumption
6.3 Output Amplifier Noise
6.3.1 Johnson Noise
6.3.2 Reset Noise
6.3.3 White Noise
6.3.4 Flicker Noise
6.3.5 Shot Noise
6.3.6 Contact and Popcorn Noise
6.3.7 Output Amplifier Noise Equation
6.4 Correlated Double Sampling
6.4.1 Correlated Double Sampling Circuit Elements
6.4.2 Correlated Double Sampling Circuits
6.4.3 Camera Gain Constant
6.4.4 Correlated Double Sampling Transfer Function
6.5 Dual Slope Processor
6.5.1 Dual Slope Circuit Elements
6.5.2 Dual Slope Transfer Function
6.6 Remnant Signal and Noise
6.6.1 Remnant Signal
6.6.2 Remnant Noise
6.7 Skipper Amplifier
6.7.1 Introduction
6.7.2 Operation
6.7.3 Performance
6.7.4 Design
6.7.5 Signal-to-Noise (Extended Images)
6.7.6 Signal-to-Noise (Point Images)
References

PERSONAL SIGN IN
Full access may be available with your subscription

Email or Username Forgot your username?

Password Forgot your password?

Show

Remember Email/Username on this computer

Remember Password

No SPIE account? Create an account
or Institutional Sign In via Shibboleth

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $0.00

Non-members: $0.00 ADD TO CART

Access to SPIE eBooks is limited to subscribing institutions. Access is not available as part of an individual subscription.

Purchase complete book on SPIE.org.

Shibboleth users login to see if you have access.

CHAPTER 7.

Noise Sources

Chapter Outline +

7.1 On-chip Noise Sources
7.1.1 Dark Current
7.1.2 Spurious Charge
7.1.3 Fat-zero
7.1.4 Transfer Noise
7.1.5 Residual Image
7.1.6 Luminescence
7.1.7 Cosmic Rays and Radiation Interference
7.1.8 Excess Charge
7.1.9 Cosmetic Defects
7.1.10 Blem Spillover
7.1.11 Seam Noise
7.2 Off-chip Noise Sources
7.2.1 Light Leak
7.2.2 Preamplifier Noise
7.2.3 ADC Quantizing Noise
7.2.4 Clock-Jitter Noise
7.2.5 Electromagnetic Interference
7.2.6 Grounding
7.2.7 Image Cross Talk
7.2.8 Noise-Reduction Techniques
7.2.9 Noise-Reduction Summary
References

PERSONAL SIGN IN
Full access may be available with your subscription

Email or Username Forgot your username?

Password Forgot your password?

Show

Remember Email/Username on this computer

Remember Password

No SPIE account? Create an account
or Institutional Sign In via Shibboleth

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $0.00

Non-members: $0.00 ADD TO CART

Access to SPIE eBooks is limited to subscribing institutions. Access is not available as part of an individual subscription.

Purchase complete book on SPIE.org.

Shibboleth users login to see if you have access.

CHAPTER 8.

Damage

Chapter Outline +

8.1 Radiation Damage
8.1.1 Introduction
8.1.2 Near-Earth Radiation Environment
8.1.3 Radiation Units
8.1.4 Transient Events
8.1.5 Ionization Damage Equivalence
8.1.6 Ionization Damage
8.1.7 Clock and Bias for Minimum Ionization Damage and Control
8.1.8 Ionization Damage Measurements
8.1.9 Bulk Damage
8.2 Electrical, Thermal and ESD Damage
8.2.1 Electrical Damage
8.2.2 Thermal Damage
8.2.3 Electrostatic Discharge (ESD) Damage
References

PERSONAL SIGN IN
Full access may be available with your subscription

Email or Username Forgot your username?

Password Forgot your password?

Show

Remember Email/Username on this computer

Remember Password

No SPIE account? Create an account
or Institutional Sign In via Shibboleth

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $0.00

Non-members: $0.00 ADD TO CART

Access to SPIE eBooks is limited to subscribing institutions. Access is not available as part of an individual subscription.

Purchase complete book on SPIE.org.

Shibboleth users login to see if you have access.

Appendixes

PERSONAL SIGN IN
Full access may be available with your subscription

Email or Username Forgot your username?

Password Forgot your password?

Show

Remember Email/Username on this computer

Remember Password

No SPIE account? Create an account
or Institutional Sign In via Shibboleth

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $0.00

Non-members: $0.00 ADD TO CART

Access to SPIE eBooks is limited to subscribing institutions. Access is not available as part of an individual subscription.

Purchase complete book on SPIE.org.

Shibboleth users login to see if you have access.

Glossary of CCD Terms

PERSONAL SIGN IN
Full access may be available with your subscription

Email or Username Forgot your username?

Password Forgot your password?

Show

Remember Email/Username on this computer

Remember Password

No SPIE account? Create an account
or Institutional Sign In via Shibboleth

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $0.00

Non-members: $0.00 ADD TO CART

Access to SPIE eBooks is limited to subscribing institutions. Access is not available as part of an individual subscription.

Purchase complete book on SPIE.org.

Shibboleth users login to see if you have access.

Back Matter

DOWNLOAD PDF

Access to SPIE eBooks is limited to subscribing institutions. Access is not available as part of an individual subscription.

Purchase complete book on SPIE.org.

Shibboleth users login to see if you have access.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

Subscribe to Digital Library

Receive Email Alerts on Newly Released Titles

Buy this book on SPIE.org

Content Email Alerts notify you when a new paper has been published.

Visit My Account to manage your email alerts.

Author a Spotlight

PUBLISH A SHORT TUTORIAL
OR OVERVIEW

Open Calls for Spotlights

Access & Subscriptions

INFORMATION FOR
INSTITUTIONS & INDIVIDUALS

Subscribe Today

Become an Author

JOIN THE DISTINGUISHED TEAM OF SPIE PRESS AUTHORS

Write with Us

Keywords/Phrases

Search In:

Publication Years