Emission Spectroscopy in the Mid-infrared using FTIR Spectrometry

Zhang, Yong-Gang, Shanghai Institute of Microsystem and Information Technology

doi:10.1117/3.1002245.ch26

Book: The Wonder of Nanotechnology: Quantum Optoelectronic Devices and Applications

Editor(s): Leo Esaki; Klaus von Klitzing; Manijeh Razeghi

Author(s): Yong-Gang Zhang

Published: 2013

https://doi.org/10.1117/3.1002245.ch26

Author Affiliations +

Abstract

Emission spectroscopy, including the photoluminescence (PL) spectrum, the electroluminescence (EL) spectrum, and lasing spectra (LS), has become a useful tool in the scientific research and industry development of semiconductor optoelectronic materials and devices. Among different spectroscopy schemes, Fourier transform infrared (FTIR) spectrometers are widely used, especially in the mid-infrared (MIR) band. Through a simple review of FTIR and detailed analysis of its merits and limitations in emission spectroscopy, an improved FTIR spectroscopy system adopting a simple, convenient, and universal emission accessory attached to a commercial FTIR spectrometer with a diode-pumped solid state (DPSS) laser for PL is introduced in this chapter. Based on this system, three different FTIR spectroscopy modes, rapid scan (RS), double modulation (DM), and step scan (SS), are adequately demonstrated on various PL, EL, and LS samples.