Fringe patterns can be formed coherently using various interferometers and incoherently using the moiré technique. They can also be designed in fringe projection profilometry. All of these techniques are useful for full-field, noncontact, and high-sensitivity measurement. The primary goal of fringe pattern analysis is to extract the hidden phase distributions that generally relate to the physical quantities being measured. This book addresses the challenges and solutions involved in this process. Both theoretical analysis and algorithm development are covered to facilitate the work of both researchers and engineers. The information herein may also serve as a specialized subject for students of optical and computer engineering. Readers are encouraged to provide the author with feedback for improvement.

I would like to thank all of my collaborators, Prof. Anand Asundi, Dr. Yu Fu, Dr. Wenjing Gao, Dr. Lei Huang, Ms. Nguyen Thi Thanh Huyen, Prof. Li Kai, Prof. Feng Lin, Dr. Qi Liu, Dr. Ho Sy Loi, Prof. Hong Miao, Mr. Le Tran Hoai Nam, Prof. Bing Pan, Prof. Hock Soon Seah, Dr. Fangjun Shu, Prof. Xianyu Su, Dr. Haixia Wang, Prof. Xiaoping Wu, Prof. Huimin Xie, Prof. Boqin Xu, Prof. Qican Zhang, and Mr. Ming Zhao. Because of you, I have been enjoying the beauty of fringe patterns. Special thanks go to Dr. Lei Huang, Dr. Haixia Wang, and Dr. Wenjing Gao for proofreading my manuscript, and to the peer reviewers who provided encouragement and constructive comments. Thanks also go to Mr. Timothy Lamkins for quickly turning a proposal into a project, to editor Kerry Eastwood for her professional and terrific hard work on the manuscript, to the SPIE staff who have helped facilitate the production of this book, and to SPIE Press for publishing the book. Finally, I owe much thanks to my parents, my parents-in- law, my wife Xiaocong, and my son Zihan for their love and support.

Qian Kemao

Nanyang Technological University

July 2013