Open Access
29 June 2015 Thermal stress test of the depth-graded platinum/carbon reflectors
Yoshitomo Maeda, Kou Ichihara, Hiroaki Kan, Yu Shionome, Takuro Sato, Toshiki Sato, Takayuki Hayashi, Manabu Ishida, Yoshiharu Namba, Hideaki Takahashi, Takuya Miyazawa, Kazunori Ishibashi, Michito Sakai, Satoshi Sugita, Yoshito Haba, Hironori Matsumoto, Hideyuki Mori
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Abstract
The ASTRO-H hard x-ray telescope (HXT) is designed to reflect hard x-rays with energies up to 80 keV. It will make use of thin-foil, multinested conical optics with depth-graded platinum/carbon (Pt/C) multilayers. We report on thermal stress tests of the HXT reflectors. The reflectors were fabricated on a heat-formed aluminum substrate of thickness gauged at 200  μm of the alloy 5052. This was followed by an epoxy replication on Pt/C-sputtered smooth Pyrex cylindrical mandrels to acquire the x-ray reflective surface. For the thermal tests, the reflectors were maintained at three different temperatures: −5, 50, and 60°C, respectively, for a week. We found that the surface of the reflectors were significantly changed at temperatures of 60°C or higher. The change appears as wrinkles with a typical scale length of a few tens of microns. No changes on the surface were observed from the −5 and 50°C samples. There was also no change in the x-ray reflectivity for these two temperatures.
CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
Yoshitomo Maeda, Kou Ichihara, Hiroaki Kan, Yu Shionome, Takuro Sato, Toshiki Sato, Takayuki Hayashi, Manabu Ishida, Yoshiharu Namba, Hideaki Takahashi, Takuya Miyazawa, Kazunori Ishibashi, Michito Sakai, Satoshi Sugita, Yoshito Haba, Hironori Matsumoto, and Hideyuki Mori "Thermal stress test of the depth-graded platinum/carbon reflectors," Journal of Astronomical Telescopes, Instruments, and Systems 1(3), 034001 (29 June 2015). https://doi.org/10.1117/1.JATIS.1.3.034001
Published: 29 June 2015
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Cited by 1 scholarly publication.
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KEYWORDS
Reflectors

X-rays

Reflectivity

Microscopes

Epoxies

Hard x-rays

Aerospace engineering

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