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1 November 2010 Estimation of leaf nitrogen and silicon using hyperspectral remote sensing
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The potential to estimate the nutrient status in important agricultural crops such as maize and sugarcane is of significant interest. In South African sugarcane agriculture, just like in global ecosystem, the estimation of Nitrogen (N) and Silicon (Si) is very important. These nutrients are one of the factors influencing the prevalence of the stalk borer Eldana saccharina Walker (Lepidoptera: Pyralidae). Therefore, the researchers aim at estimating leaf N and Si concentration as well as their ratio in sugarcane using hyperspectral remote sensing (spectroradiometry) for monitoring E. saccharina. A hand-held Analytical Spectral Devices (ASD) Field Spec® 3 spectroradiometer was used to take leaf spectral measurements of sugarcane plants from a potted-plant trial taking place under shade house conditions. In this trial, nitrogen and silicon nutrient applications as well as varieties used were known. In addition, watering regimes and artificial infestation of E. saccharina were carefully controlled. The study results indicate that the Red-edge Index (R740/R720) is linearly related to N concentration (R2 = 0.81, Root Mean Square Error (RMSE) = 0.103) for N37 with the highest correlation coefficient. For Si, the index (R750-R560)/(R750+R560) was linearly related to Si concentration (R2 = 0.53, RMSE = 0.118) for N25. Finally, the N:Si ratio was linearly correlated to the index (R1075-R730)/(R1075+R730) (R2 = 0.67, RMSE = 1.508) for N37, hence this index can be used for early detection of E. saccharina damage or for identifying sugarcane that is prone to attack by E. saccharina. It was concluded that hyperspectral remote sensing has potential for use in estimating the N:Si ratio and E. saccharina potential infestations can be monitored rapidly and nondestructively in sugarcane under controlled conditions. It is recommended that an advanced study be conducted in field conditions using airborne and/or spaceborne hyperspectral sensors.
Tholang A. Mokhele and Fethi B. Ahmed "Estimation of leaf nitrogen and silicon using hyperspectral remote sensing," Journal of Applied Remote Sensing 4(1), 043560 (1 November 2010).
Published: 1 November 2010

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