7 January 2016 Speedster-EXD: a new event-driven hybrid CMOS x-ray detector
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Abstract
The Speedster-EXD is a new 64×64  pixel2, 40-μm  pixel pitch, 100-μm depletion depth hybrid CMOS x-ray detector with the capability of reading out only those pixels containing event charge, thus enabling fast effective frame rates. A global charge threshold can be specified, and pixels containing charge above this threshold are flagged and read out. The Speedster detector has also been designed with other advanced in-pixel features to improve performance, including a low-noise, high-gain capacitive transimpedance amplifier that eliminates interpixel capacitance crosstalk (IPC), and in-pixel correlated double sampling subtraction to reduce reset noise. We measure the best energy resolution on the Speedster-EXD detector to be 206 eV (3.5%) at 5.89 keV and 172 eV (10.0%) at 1.49 keV. The average IPC to the four adjacent pixels is measured to be 0.25%±0.2% (i.e., consistent with zero). The pixel-to-pixel gain variation is measured to be 0.80%±0.03%, and a Monte Carlo simulation is applied to better characterize the contributions to the energy resolution.
© 2016 Society of Photo-Optical Instrumentation Engineers (SPIE)
Christopher V. Griffith, Abraham D. Falcone, Zachary R. Prieskorn, David N. Burrows, "Speedster-EXD: a new event-driven hybrid CMOS x-ray detector," Journal of Astronomical Telescopes, Instruments, and Systems 2(1), 016001 (7 January 2016). https://doi.org/10.1117/1.JATIS.2.1.016001 . Submission:
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