9 June 2016 Postirradiation behavior of p-channel charge-coupled devices irradiated at 153 K
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The displacement damage hardness that can be achieved using p-channel charge-coupled devices (CCD) was originally demonstrated in 1997, and since then a number of other studies have demonstrated an improved tolerance to radiation-induced charge transfer inefficiency when compared to n-channel CCDs. A number of recent studies have also shown that the temperature history of the device after the irradiation impacts the performance of the detector, linked to the mobility of defects at different temperatures. The initial results from an e2v technologies p-channel CCD204 irradiated at 153 K with 10-MeV equivalent proton fluences of 1.24×109 and 1.24×1011  protons cm−2 is described. The dark current, cosmetic quality, and the number of defects identified using trap pumping immediately were monitored after the irradiation for a period of 150 h with the device held at 153 K and then after different periods of time at room temperature. The device also exhibited a flatband voltage shift of around 30  mV/krad, determined by the reduction in full well capacity.
© 2016 Society of Photo-Optical Instrumentation Engineers (SPIE)
Jason P. D. Gow, Jason P. D. Gow, Daniel Wood, Daniel Wood, Neil J. Murray, Neil J. Murray, David Burt, David Burt, David J. Hall, David J. Hall, Ben Dryer, Ben Dryer, Andrew D. Holland, Andrew D. Holland, } "Postirradiation behavior of p-channel charge-coupled devices irradiated at 153 K," Journal of Astronomical Telescopes, Instruments, and Systems 2(2), 026001 (9 June 2016). https://doi.org/10.1117/1.JATIS.2.2.026001 . Submission:

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