14 August 2018 Characterizing subpixel spatial resolution of a hybrid CMOS detector
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Abstract
Soft x-rays (0.1 to 10 keV) will liberate between tens and thousands of electrons from the absorber array of a depleted silicon detector. These electrons tend to diffuse outward into what is referred to as the charge cloud, which is then picked up by several pixels and forms a specific pattern based on the exact incident location of the x-ray. By performing the first ever application of a “mesh experiment” on a hybrid CMOS detector (HCD), we have experimentally determined the charge cloud shape and used it to perform subpixel localization of incident x-rays on a photon-by-photon basis for a custom 36-μm pixel pitch H2RG HCD. We find that significant spatial resolution improvement is possible for all events, with 68% confidence regions equal to 7.1  ×  7.1, 0.4  ×  7.1, and 0.4  ×  0.4  μm for 1-pixel, 2-pixel, and 3- to 4-pixel events, respectively. This represents a much finer resolution than that provided by containment within a single pixel.
© 2018 Society of Photo-Optical Instrumentation Engineers (SPIE)
Evan Bray, Evan Bray, Abraham Falcone, Abraham Falcone, Mitchell Wages, Mitchell Wages, Tanmoy Chattopadhyay, Tanmoy Chattopadhyay, David N. Burrows, David N. Burrows, } "Characterizing subpixel spatial resolution of a hybrid CMOS detector," Journal of Astronomical Telescopes, Instruments, and Systems 4(3), 038002 (14 August 2018). https://doi.org/10.1117/1.JATIS.4.3.038002 . Submission: Received: 17 April 2018; Accepted: 26 July 2018
Received: 17 April 2018; Accepted: 26 July 2018; Published: 14 August 2018
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